Characterization and Identification of Defects in CdTe Detectors Using Scanning Laser Transient Current Technique

Activity: Talk or presentation types › Oral presentation

Period5 Nov 2020
Event title2020 Virtual IEEE Nuclear Science Symposium and Medical Imaging Conference: The 27th International Symposium on Room-Temperature Semiconductor Detectors
Event typeConference
Degree of RecognitionInternational