Photo of Filip Tuomisto
  • PL 43 (Pietari Kalmin katu 2)



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Personal profile

Research interests

My scientific research work focuses on the fundamental connection between macroscopic properties and atomic-level structure of materials. The methodology of choice is positron annihilation spectroscopy that is particularly suitable for lattice defect characterization in solids. The power of positron spectroscopies lies in (i) the selective sensitivity to open volume structures, (ii) the possibility of studying materials of any type (conductive, insulating, hard, soft, crystalline, or porous) and (iii) the possibility of direct comparison of theoretical calculations and experimental observations. My group is is one of the world’s leading teams in developing the methodology, instrumentation, applications and theory of positron annihilation spectroscopy of semiconductor materials and devices.

Fields of Science

  • 114 Physical sciences

International and National Collaboration Publications and projects within past five years.

Publications 2003 2020

Characterisation and Control of Defects in Semiconductors

Tuomisto, F. (ed.), 2019, London: Institution of engineering and technology. 596 p.

Research output: Book/ReportAnthology or special issue

Direct observation of mono-vacancy and self-interstitial recovery in tungsten

Heikinheimo, J., Mizohata, K., Räisänen, J., Ahlgren, T., Jalkanen, P., Lahtinen, A., Catarino, N., Alves, E. & Tuomisto, F., Feb 2019, In : Physical Review Materials. 7, 2, 5 p., 021103.

Research output: Contribution to journalArticleScientificpeer-review

Open Access

Ga vacancies and electrical compensation in beta-Ga2O3 thin films studied with positron annihilation spectroscopy

Tuomisto, F., Karjalainen, A., Prozheeva, V., Makkonen, I., Wagner, G. & Baldini, M., 2019, Oxide-Based Materials and Devices X. Rogers, DJ., Look, DC. & Teherani, FH. (eds.). Bellingham: SPIE - the international society for optics and photonics, 8 p. (Proceedings of SPIE; vol. 10919).

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Positron annihilation spectroscopy, experimental and theoretical aspects

Slotte, J., Makkonen, I. & Tuomisto, F., 2019, Characterisation and Control of Defects in Semiconductors. Tuomisto, F. (ed.). London: Institution of engineering and technology, p. 263-288 26 p.

Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review