A high-energy-resolution resonant inelastic X-ray scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

M. Moretti Sala, K. Martel, C. Henriquet, A. Al Zein, L. Simonelli, Ch. J. Sahle, H. Gonzalez, M.-C. Lagier, C. Ponchut, S. Huotari, R. Verbeni, M. Krisch, G. Monaco

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
JournalJournal of Synchrotron Radiation
Volume25
Pages (from-to)580-591
Number of pages12
ISSN1600-5775
DOIs
Publication statusPublished - Mar 2018
MoE publication typeA1 Journal article-refereed

Fields of Science

  • resonant inelastic X-ray scattering
  • X-ray emission
  • ID20 beamline
  • RIXS spectrometer
  • ESRF
  • POSITION-SENSITIVE DETECTORS
  • ANALYZER CRYSTALS
  • L-3 EDGE
  • EXCITATIONS
  • SUPERCONDUCTORS
  • RIXS
  • SPECTROSCOPY
  • SPECTRA
  • 114 Physical sciences

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