A novel method to orient semiconducting polymer films

Tomas G Bäcklund, Henrik G. O Sadberg, Ronald Österbacka, Henrik Stubb, Mika Torkkeli, Ritva Serimaa

    Research output: Contribution to journalArticleScientificpeer-review

    Abstract

    "We present a new technique for orienting polymer semiconductor thin films. In our technique, polymer chains are rigorously oriented without using any mechanical tools and with minimal risk of film contamination. The technique is based on the mechanical force resulting from the in-plane shrinkage exerted by a shrinker (top layer) that is used to orient the semiconductor beneath an intermediate layer; the latter acting as a force mediator. The chain orientation is demonstrated by several techniques such as crossed-polarizer microscopy, atomic force microscopy, grazing-incidence X-ray diffraction, and polarized absorption. The orientation geometry is controlled by the shrinking process and the shrinker area. The semiconductivity of the film only stems from the transistor device structures under study, and the method can therefore be generalized."
    Original languageEnglish
    JournalAdvanced Functional Materials
    Volume15
    Issue number7
    Pages (from-to)1095-1099
    Number of pages5
    ISSN1616-301X
    DOIs
    Publication statusPublished - 2005
    MoE publication typeA1 Journal article-refereed

    Cite this

    Bäcklund, T. G., Sadberg, H. G. O., Österbacka, R., Stubb, H., Torkkeli, M., & Serimaa, R. (2005). A novel method to orient semiconducting polymer films. Advanced Functional Materials, 15(7), 1095-1099. https://doi.org/10.1002/adfm.200400448
    Bäcklund, Tomas G ; Sadberg, Henrik G. O ; Österbacka, Ronald ; Stubb, Henrik ; Torkkeli, Mika ; Serimaa, Ritva. / A novel method to orient semiconducting polymer films. In: Advanced Functional Materials. 2005 ; Vol. 15, No. 7. pp. 1095-1099.
    @article{a6d928aac37a4357881460812b69a2d8,
    title = "A novel method to orient semiconducting polymer films",
    abstract = "{"}We present a new technique for orienting polymer semiconductor thin films. In our technique, polymer chains are rigorously oriented without using any mechanical tools and with minimal risk of film contamination. The technique is based on the mechanical force resulting from the in-plane shrinkage exerted by a shrinker (top layer) that is used to orient the semiconductor beneath an intermediate layer; the latter acting as a force mediator. The chain orientation is demonstrated by several techniques such as crossed-polarizer microscopy, atomic force microscopy, grazing-incidence X-ray diffraction, and polarized absorption. The orientation geometry is controlled by the shrinking process and the shrinker area. The semiconductivity of the film only stems from the transistor device structures under study, and the method can therefore be generalized.{"}",
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    Bäcklund, TG, Sadberg, HGO, Österbacka, R, Stubb, H, Torkkeli, M & Serimaa, R 2005, 'A novel method to orient semiconducting polymer films' Advanced Functional Materials, vol. 15, no. 7, pp. 1095-1099. https://doi.org/10.1002/adfm.200400448

    A novel method to orient semiconducting polymer films. / Bäcklund, Tomas G; Sadberg, Henrik G. O; Österbacka, Ronald; Stubb, Henrik; Torkkeli, Mika; Serimaa, Ritva.

    In: Advanced Functional Materials, Vol. 15, No. 7, 2005, p. 1095-1099.

    Research output: Contribution to journalArticleScientificpeer-review

    TY - JOUR

    T1 - A novel method to orient semiconducting polymer films

    AU - Bäcklund, Tomas G

    AU - Sadberg, Henrik G. O

    AU - Österbacka, Ronald

    AU - Stubb, Henrik

    AU - Torkkeli, Mika

    AU - Serimaa, Ritva

    PY - 2005

    Y1 - 2005

    N2 - "We present a new technique for orienting polymer semiconductor thin films. In our technique, polymer chains are rigorously oriented without using any mechanical tools and with minimal risk of film contamination. The technique is based on the mechanical force resulting from the in-plane shrinkage exerted by a shrinker (top layer) that is used to orient the semiconductor beneath an intermediate layer; the latter acting as a force mediator. The chain orientation is demonstrated by several techniques such as crossed-polarizer microscopy, atomic force microscopy, grazing-incidence X-ray diffraction, and polarized absorption. The orientation geometry is controlled by the shrinking process and the shrinker area. The semiconductivity of the film only stems from the transistor device structures under study, and the method can therefore be generalized."

    AB - "We present a new technique for orienting polymer semiconductor thin films. In our technique, polymer chains are rigorously oriented without using any mechanical tools and with minimal risk of film contamination. The technique is based on the mechanical force resulting from the in-plane shrinkage exerted by a shrinker (top layer) that is used to orient the semiconductor beneath an intermediate layer; the latter acting as a force mediator. The chain orientation is demonstrated by several techniques such as crossed-polarizer microscopy, atomic force microscopy, grazing-incidence X-ray diffraction, and polarized absorption. The orientation geometry is controlled by the shrinking process and the shrinker area. The semiconductivity of the film only stems from the transistor device structures under study, and the method can therefore be generalized."

    U2 - 10.1002/adfm.200400448

    DO - 10.1002/adfm.200400448

    M3 - Article

    VL - 15

    SP - 1095

    EP - 1099

    JO - Advanced Functional Materials

    JF - Advanced Functional Materials

    SN - 1616-301X

    IS - 7

    ER -

    Bäcklund TG, Sadberg HGO, Österbacka R, Stubb H, Torkkeli M, Serimaa R. A novel method to orient semiconducting polymer films. Advanced Functional Materials. 2005;15(7):1095-1099. https://doi.org/10.1002/adfm.200400448