A SECONDARY-ION-MASS-SPECTROMETRY STUDY OF LOW-ENERGY ION-BEAM MIXING OF AU-PT INTERFACES

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@article{624f4b8606094b789dbbb8ee8b513903,

title = "A SECONDARY-ION-MASS-SPECTROMETRY STUDY OF LOW-ENERGY ION-BEAM MIXING OF AU-PT INTERFACES",

keywords = "DEPTH RESOLUTION, METALS, ALLOYS, MODEL",

author = "J LIKONEN and M HAUTALA and I KOPONEN",

year = "1992",

language = "English",

volume = "72",

pages = "5898--5904",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

}