Advances in crystal analyzers for inelastic X-ray scattering

R Verbeni, M Kocsis, S Huotari, M Krisch, G Monaco, F Sette, G Vanko

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
JournalJournal of Physics and Chemistry of Solids
Volume66
Issue number12
Pages (from-to)2299-2305
Number of pages7
ISSN0022-3697
DOIs
Publication statusPublished - Dec 2005
Externally publishedYes
MoE publication typeA1 Journal article-refereed

Fields of Science

  • X-ray diffraction
  • MEV ENERGY RESOLUTION
  • SILICON

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