Analysis of AlN thin films by combining TOF-ERDA and NRB techniques

Janne Jokinen, Pekka Haussalo, Juhani Keinonen, Mikko Ritala, Markku Leskelä, Diana Riihelä

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
JournalThin Solid Films
Volume289
Issue number1-2
Pages (from-to)159-165
Number of pages7
ISSN0040-6090
Publication statusPublished - 1996
MoE publication typeA1 Journal article-refereed

Fields of Science

  • aluminium nitride
  • depth profiling
  • nuclear resonance broadening
  • time-of-flight elastic recoil detection analysis
  • ELASTIC RECOIL DETECTION
  • LIGHT-ELEMENTS
  • SPECTROMETRY
  • MASS
  • RESOLUTION
  • HYDROGEN
  • SYSTEM
  • 114 Physical sciences
  • 116 Chemical sciences

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