Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers

Research output: Conference materialsAbstractResearch

Original languageEnglish
Publication statusSubmitted - 25 Jan 2018
EventE-MRS Spring Meeting - --, Strasbourg, France
Duration: 12 Dec 2009 → …

Other

OtherE-MRS Spring Meeting
CountryFrance
CityStrasbourg
Period12/12/2009 → …

Cite this

@conference{ed96f477420b41ec8d98d3e52102aec8,
title = "Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers",
author = "Christoffer Fridlund and Kai Nordlund and Flyura Djurabekova",
year = "2018",
month = "1",
day = "25",
language = "English",
note = "null ; Conference date: 12-12-2009",

}

Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers. / Fridlund, Christoffer; Nordlund, Kai; Djurabekova, Flyura.

2018. Abstract from E-MRS Spring Meeting, Strasbourg, France.

Research output: Conference materialsAbstractResearch

TY - CONF

T1 - Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers

AU - Fridlund, Christoffer

AU - Nordlund, Kai

AU - Djurabekova, Flyura

PY - 2018/1/25

Y1 - 2018/1/25

M3 - Abstract

ER -