Aspects of Technical Bias

Martin Schumacher; Frank Staedtler; Wendell Jones; Andreas Scherer

Aspects of Technical Bias

Martin Schumacher, Frank Staedtler, Wendell Jones, Andreas Scherer

Institute for Molecular Medicine Finland

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Scientific › peer-review

Abstract

Variation in microarray data can result from technical and biological sources. While the extent to which factors contribute to this variation has been largely investigated (Bakay et al. 2002; Boedigheimer et al. 2008; Eklund and Szallasi 2008; Fare et al. 2003; Han et al. 2004; Lusa et al. 2007; Novak et al. 2002; Zakharkin et al. 2005), the nature and extent of the signal intensity changes with which variation manifests itself in the data has not been a major focus of research. Using several real microarray data sets with known batch effects, we analyze and describe how technical variation is translated into gene expression changes.

Original language	English
Title of host publication	Batch effects and Noise in Microarray Experiments: Sources and Solutions
Number of pages	9
Publisher	Wiley
Publication date	2009
Pages	51-60
ISBN (Print)	978-0-470-74138-2
Publication status	Published - 2009
MoE publication type	A3 Book chapter

Cite this

@inbook{4f30738f485c4ade989478a87350230e,

title = "Aspects of Technical Bias",

abstract = "Variation in microarray data can result from technical and biological sources. While the extent to which factors contribute to this variation has been largely investigated (Bakay et al. 2002; Boedigheimer et al. 2008; Eklund and Szallasi 2008; Fare et al. 2003; Han et al. 2004; Lusa et al. 2007; Novak et al. 2002; Zakharkin et al. 2005), the nature and extent of the signal intensity changes with which variation manifests itself in the data has not been a major focus of research. Using several real microarray data sets with known batch effects, we analyze and describe how technical variation is translated into gene expression changes.",

author = "Martin Schumacher and Frank Staedtler and Wendell Jones and Andreas Scherer",

year = "2009",

language = "English",

isbn = "978-0-470-74138-2",

pages = "51--60",

booktitle = "Batch effects and Noise in Microarray Experiments: Sources and Solutions",

publisher = "Wiley",

address = "United States",

}

TY - CHAP

T1 - Aspects of Technical Bias

AU - Schumacher, Martin

AU - Staedtler, Frank

AU - Jones, Wendell

AU - Scherer, Andreas

PY - 2009

Y1 - 2009

N2 - Variation in microarray data can result from technical and biological sources. While the extent to which factors contribute to this variation has been largely investigated (Bakay et al. 2002; Boedigheimer et al. 2008; Eklund and Szallasi 2008; Fare et al. 2003; Han et al. 2004; Lusa et al. 2007; Novak et al. 2002; Zakharkin et al. 2005), the nature and extent of the signal intensity changes with which variation manifests itself in the data has not been a major focus of research. Using several real microarray data sets with known batch effects, we analyze and describe how technical variation is translated into gene expression changes.

AB - Variation in microarray data can result from technical and biological sources. While the extent to which factors contribute to this variation has been largely investigated (Bakay et al. 2002; Boedigheimer et al. 2008; Eklund and Szallasi 2008; Fare et al. 2003; Han et al. 2004; Lusa et al. 2007; Novak et al. 2002; Zakharkin et al. 2005), the nature and extent of the signal intensity changes with which variation manifests itself in the data has not been a major focus of research. Using several real microarray data sets with known batch effects, we analyze and describe how technical variation is translated into gene expression changes.

UR - http://www.the-batch-effect-book.org/

M3 - Chapter

SN - 978-0-470-74138-2

SP - 51

EP - 60

BT - Batch effects and Noise in Microarray Experiments: Sources and Solutions

PB - Wiley

ER -

Aspects of Technical Bias

Abstract

Other files and links

Cite this