Bench-top X-ray microtomography complemented with spatially localized X-ray scattering experiments

Jussi-Petteri Suuronen, Aki Petteri Kallonen, Ville Hänninen, Merja Blomberg, Keijo Hämäläinen, Ritva Serimaa

Research output: Contribution to journalArticleScientificpeer-review

Abstract

This article describes a novel experimental setup that combines X-ray microtomography (XMT) scans with in situ X-ray scattering experiments in a laboratory setting. Combining these two methods allows the characterization of both the micrometre-scale morphology and the crystallographic properties of the sample without removing it from the setup. Precise control of the position of the sample allows an accurate choice of the scattering beam path through the
sample and facilitates the performance of X-ray scattering experiments on
submillimetre-sized samples. With the present setup, a voxel size of less than
0.5 mm is achievable in the XMT images, and scattering experiments can be carried out with a beam size of approximately 200 200 mm. The potential of this setup is illustrated with the analysis of micrometeorite crystal structure and diffraction tomographic imaging of a silver behenate phantom as example applications.
Original languageEnglish
JournalJournal of Applied Crystallography
Volume47
Pages (from-to)471-475
Number of pages5
ISSN0021-8898
DOIs
Publication statusPublished - 2014
MoE publication typeA1 Journal article-refereed

Fields of Science

  • 114 Physical sciences

Cite this

Suuronen, Jussi-Petteri ; Kallonen, Aki Petteri ; Hänninen, Ville ; Blomberg, Merja ; Hämäläinen, Keijo ; Serimaa, Ritva. / Bench-top X-ray microtomography complemented with spatially localized X-ray scattering experiments. In: Journal of Applied Crystallography. 2014 ; Vol. 47. pp. 471-475.
@article{87ff116e6efa409fa9005d0eaa10c74d,
title = "Bench-top X-ray microtomography complemented with spatially localized X-ray scattering experiments",
abstract = "This article describes a novel experimental setup that combines X-ray microtomography (XMT) scans with in situ X-ray scattering experiments in a laboratory setting. Combining these two methods allows the characterization of both the micrometre-scale morphology and the crystallographic properties of the sample without removing it from the setup. Precise control of the position of the sample allows an accurate choice of the scattering beam path through thesample and facilitates the performance of X-ray scattering experiments onsubmillimetre-sized samples. With the present setup, a voxel size of less than0.5 mm is achievable in the XMT images, and scattering experiments can be carried out with a beam size of approximately 200 200 mm. The potential of this setup is illustrated with the analysis of micrometeorite crystal structure and diffraction tomographic imaging of a silver behenate phantom as example applications.",
keywords = "114 Physical sciences, microtomography, X-ray diffraction, SMALL-ANGLE SCATTERING",
author = "Jussi-Petteri Suuronen and Kallonen, {Aki Petteri} and Ville H{\"a}nninen and Merja Blomberg and Keijo H{\"a}m{\"a}l{\"a}inen and Ritva Serimaa",
year = "2014",
doi = "10.1107/S1600576713031105",
language = "English",
volume = "47",
pages = "471--475",
journal = "Journal of Applied Crystallography",
issn = "0021-8898",
publisher = "WILEY-BLACKWELL MUNKSGAARD",

}

Bench-top X-ray microtomography complemented with spatially localized X-ray scattering experiments. / Suuronen, Jussi-Petteri; Kallonen, Aki Petteri; Hänninen, Ville; Blomberg, Merja; Hämäläinen, Keijo; Serimaa, Ritva.

In: Journal of Applied Crystallography, Vol. 47, 2014, p. 471-475.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Bench-top X-ray microtomography complemented with spatially localized X-ray scattering experiments

AU - Suuronen, Jussi-Petteri

AU - Kallonen, Aki Petteri

AU - Hänninen, Ville

AU - Blomberg, Merja

AU - Hämäläinen, Keijo

AU - Serimaa, Ritva

PY - 2014

Y1 - 2014

N2 - This article describes a novel experimental setup that combines X-ray microtomography (XMT) scans with in situ X-ray scattering experiments in a laboratory setting. Combining these two methods allows the characterization of both the micrometre-scale morphology and the crystallographic properties of the sample without removing it from the setup. Precise control of the position of the sample allows an accurate choice of the scattering beam path through thesample and facilitates the performance of X-ray scattering experiments onsubmillimetre-sized samples. With the present setup, a voxel size of less than0.5 mm is achievable in the XMT images, and scattering experiments can be carried out with a beam size of approximately 200 200 mm. The potential of this setup is illustrated with the analysis of micrometeorite crystal structure and diffraction tomographic imaging of a silver behenate phantom as example applications.

AB - This article describes a novel experimental setup that combines X-ray microtomography (XMT) scans with in situ X-ray scattering experiments in a laboratory setting. Combining these two methods allows the characterization of both the micrometre-scale morphology and the crystallographic properties of the sample without removing it from the setup. Precise control of the position of the sample allows an accurate choice of the scattering beam path through thesample and facilitates the performance of X-ray scattering experiments onsubmillimetre-sized samples. With the present setup, a voxel size of less than0.5 mm is achievable in the XMT images, and scattering experiments can be carried out with a beam size of approximately 200 200 mm. The potential of this setup is illustrated with the analysis of micrometeorite crystal structure and diffraction tomographic imaging of a silver behenate phantom as example applications.

KW - 114 Physical sciences

KW - microtomography

KW - X-ray diffraction

KW - SMALL-ANGLE SCATTERING

U2 - 10.1107/S1600576713031105

DO - 10.1107/S1600576713031105

M3 - Article

VL - 47

SP - 471

EP - 475

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

SN - 0021-8898

ER -