Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging

Joan Vila-Comamala, Ana Diaz, Manuel Guizar-Sicairos, Sergey Gorelick, Vitaliy Guzenko, Petri Karvinen, Cameron Kewish, Elina Färm, Mikko Ritala, Alexandre Mantion, Oliver Bunk, Andreas Menzel, Christian David

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationAdvances in X-Ray : EUV Optics and Components VI
Number of pages7
Publication date2011
Publication statusPublished - 2011
MoE publication typeA4 Article in conference proceedings
EventAdvances in X-Ray/EUV Optics and Components VI - San Diego, California, United States
Duration: 22 Aug 201122 Aug 2011

Fields of Science

  • 116 Chemical sciences

Cite this