Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging

Joan Vila-Comamala, Ana Diaz, Manuel Guizar-Sicairos, Sergey Gorelick, Vitaliy Guzenko, Petri Karvinen, Cameron Kewish, Elina Färm, Mikko Ritala, Alexandre Mantion, Oliver Bunk, Andreas Menzel, Christian David

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationAdvances in X-Ray : EUV Optics and Components VI
Number of pages7
Volume8139
PublisherSPIE
Publication date2011
Pages81390E1-7
DOIs
Publication statusPublished - 2011
MoE publication typeA4 Article in conference proceedings
EventAdvances in X-Ray/EUV Optics and Components VI - San Diego, California, United States
Duration: 22 Aug 201122 Aug 2011

Fields of Science

  • 116 Chemical sciences

Cite this

Vila-Comamala, J., Diaz, A., Guizar-Sicairos, M., Gorelick, S., Guzenko, V., Karvinen, P., ... David, C. (2011). Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging. In Advances in X-Ray: EUV Optics and Components VI (Vol. 8139, pp. 81390E1-7). SPIE. https://doi.org/10.1117/12.893235
Vila-Comamala, Joan ; Diaz, Ana ; Guizar-Sicairos, Manuel ; Gorelick, Sergey ; Guzenko, Vitaliy ; Karvinen, Petri ; Kewish, Cameron ; Färm, Elina ; Ritala, Mikko ; Mantion, Alexandre ; Bunk, Oliver ; Menzel, Andreas ; David, Christian. / Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging. Advances in X-Ray: EUV Optics and Components VI. Vol. 8139 SPIE, 2011. pp. 81390E1-7
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title = "Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging",
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author = "Joan Vila-Comamala and Ana Diaz and Manuel Guizar-Sicairos and Sergey Gorelick and Vitaliy Guzenko and Petri Karvinen and Cameron Kewish and Elina F{\"a}rm and Mikko Ritala and Alexandre Mantion and Oliver Bunk and Andreas Menzel and Christian David",
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year = "2011",
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Vila-Comamala, J, Diaz, A, Guizar-Sicairos, M, Gorelick, S, Guzenko, V, Karvinen, P, Kewish, C, Färm, E, Ritala, M, Mantion, A, Bunk, O, Menzel, A & David, C 2011, Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging. in Advances in X-Ray: EUV Optics and Components VI. vol. 8139, SPIE, pp. 81390E1-7, Advances in X-Ray/EUV Optics and Components VI, San Diego, California, United States, 22/08/2011. https://doi.org/10.1117/12.893235

Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging. / Vila-Comamala, Joan; Diaz, Ana; Guizar-Sicairos, Manuel; Gorelick, Sergey; Guzenko, Vitaliy; Karvinen, Petri; Kewish, Cameron; Färm, Elina; Ritala, Mikko; Mantion, Alexandre; Bunk, Oliver; Menzel, Andreas; David, Christian.

Advances in X-Ray: EUV Optics and Components VI. Vol. 8139 SPIE, 2011. p. 81390E1-7.

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

TY - GEN

T1 - Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging

AU - Vila-Comamala, Joan

AU - Diaz, Ana

AU - Guizar-Sicairos, Manuel

AU - Gorelick, Sergey

AU - Guzenko, Vitaliy

AU - Karvinen, Petri

AU - Kewish, Cameron

AU - Färm, Elina

AU - Ritala, Mikko

AU - Mantion, Alexandre

AU - Bunk, Oliver

AU - Menzel, Andreas

AU - David, Christian

N1 - Volume: Proceeding volume: 8139

PY - 2011

Y1 - 2011

KW - 116 Chemical sciences

U2 - 10.1117/12.893235

DO - 10.1117/12.893235

M3 - Conference contribution

VL - 8139

SP - 81390E1-7

BT - Advances in X-Ray

PB - SPIE

ER -

Vila-Comamala J, Diaz A, Guizar-Sicairos M, Gorelick S, Guzenko V, Karvinen P et al. Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging. In Advances in X-Ray: EUV Optics and Components VI. Vol. 8139. SPIE. 2011. p. 81390E1-7 https://doi.org/10.1117/12.893235