| Original language | English |
|---|---|
| Title of host publication | Advances in X-Ray : EUV Optics and Components VI |
| Number of pages | 7 |
| Volume | 8139 |
| Publisher | SPIE |
| Publication date | 2011 |
| Pages | 81390E1-7 |
| DOIs | |
| Publication status | Published - 2011 |
| MoE publication type | A4 Article in conference proceedings |
| Event | Advances in X-Ray/EUV Optics and Components VI - San Diego, California, United States Duration: 22 Aug 2011 → 22 Aug 2011 |
Fields of Science
- 116 Chemical sciences
Cite this
}
Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging. / Vila-Comamala, Joan; Diaz, Ana; Guizar-Sicairos, Manuel; Gorelick, Sergey; Guzenko, Vitaliy; Karvinen, Petri; Kewish, Cameron; Färm, Elina; Ritala, Mikko; Mantion, Alexandre; Bunk, Oliver; Menzel, Andreas; David, Christian.
Advances in X-Ray: EUV Optics and Components VI. Vol. 8139 SPIE, 2011. p. 81390E1-7.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review
TY - GEN
T1 - Characterization of a 20-nm hard x-ray focus by ptychographic coherent diffractive imaging
AU - Vila-Comamala, Joan
AU - Diaz, Ana
AU - Guizar-Sicairos, Manuel
AU - Gorelick, Sergey
AU - Guzenko, Vitaliy
AU - Karvinen, Petri
AU - Kewish, Cameron
AU - Färm, Elina
AU - Ritala, Mikko
AU - Mantion, Alexandre
AU - Bunk, Oliver
AU - Menzel, Andreas
AU - David, Christian
N1 - Volume: Proceeding volume: 8139
PY - 2011
Y1 - 2011
KW - 116 Chemical sciences
U2 - 10.1117/12.893235
DO - 10.1117/12.893235
M3 - Conference contribution
VL - 8139
SP - 81390E1-7
BT - Advances in X-Ray
PB - SPIE
ER -