Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance

Johana Kuncova-Kallio; Annika Jokinen; Janusz W. Sadowski; Niko Granqvist

Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance

Johana Kuncova-Kallio, Annika Jokinen, Janusz W. Sadowski, Niko Granqvist

Faculty of Pharmacy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO)
Editors	A Sill, R Liu, W Li
Number of pages	5
Publication date	2013
Pages	259-263
Publication status	Published - 2013
MoE publication type	A4 Article in conference proceedings
Event	INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE - Duration: 1 Jan 1800 → …

Publication series

Name	International Conference on Manipulation Manufacturing and Measurement on the Nanoscale
Publisher	IEEE
ISSN (Print)	2373-5422

Fields of Science

multi-parametric surface plasmon resonance
refractive index
thickness
thin film deposition
absorbing film
nanolaminate
SPR
characterization
ellipsometry
Langmuir-Blodgett
ALD
CVD
SPECTROSCOPIC ELLIPSOMETRY
FILMS
317 Pharmacy

Cite this

Kuncova-Kallio, J., Jokinen, A., Sadowski, J. W., & Granqvist, N. (2013). Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance. In A. Sill, R. Liu, & W. Li (Eds.), 2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO) (pp. 259-263). (International Conference on Manipulation Manufacturing and Measurement on the Nanoscale).

Kuncova-Kallio, Johana ; Jokinen, Annika ; Sadowski, Janusz W. et al. / Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance. 2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO). editor / A Sill ; R Liu ; W Li. 2013. pp. 259-263 (International Conference on Manipulation Manufacturing and Measurement on the Nanoscale).

@inproceedings{0f7a4bcddc5244b0831cb12f1dfae8d3,

title = "Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance",

keywords = "multi-parametric surface plasmon resonance, refractive index, thickness, thin film deposition, absorbing film, nanolaminate, SPR, characterization, ellipsometry, Langmuir-Blodgett, ALD, CVD, SPECTROSCOPIC ELLIPSOMETRY, FILMS, 317 Pharmacy",

author = "Johana Kuncova-Kallio and Annika Jokinen and Sadowski, {Janusz W.} and Niko Granqvist",

year = "2013",

language = "English",

series = "International Conference on Manipulation Manufacturing and Measurement on the Nanoscale",

publisher = "IEEE",

pages = "259--263",

editor = "A Sill and R Liu and W Li",

booktitle = "2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO)",

note = "INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE ; Conference date: 01-01-1800",

}

Kuncova-Kallio, J, Jokinen, A, Sadowski, JW & Granqvist, N 2013, Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance. in A Sill, R Liu & W Li (eds), 2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO). International Conference on Manipulation Manufacturing and Measurement on the Nanoscale, pp. 259-263, INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE, 01/01/1800.

Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance. / Kuncova-Kallio, Johana; Jokinen, Annika; Sadowski, Janusz W. et al.

2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO). ed. / A Sill; R Liu; W Li. 2013. p. 259-263 (International Conference on Manipulation Manufacturing and Measurement on the Nanoscale).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance

AU - Kuncova-Kallio, Johana

AU - Jokinen, Annika

AU - Sadowski, Janusz W.

AU - Granqvist, Niko

PY - 2013

Y1 - 2013

KW - multi-parametric surface plasmon resonance

KW - refractive index

KW - thickness

KW - thin film deposition

KW - absorbing film

KW - nanolaminate

KW - SPR

KW - characterization

KW - ellipsometry

KW - Langmuir-Blodgett

KW - ALD

KW - CVD

KW - SPECTROSCOPIC ELLIPSOMETRY

KW - FILMS

KW - 317 Pharmacy

M3 - Conference contribution

T3 - International Conference on Manipulation Manufacturing and Measurement on the Nanoscale

SP - 259

EP - 263

BT - 2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO)

A2 - Sill, A

A2 - Liu, R

A2 - Li, W

T2 - INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE

Y2 - 1 January 1800

ER -

Kuncova-Kallio J, Jokinen A, Sadowski JW, Granqvist N. Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance. In Sill A, Liu R, Li W, editors, 2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO). 2013. p. 259-263. (International Conference on Manipulation Manufacturing and Measurement on the Nanoscale).