Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance

Johana Kuncova-Kallio, Annika Jokinen, Janusz W. Sadowski, Niko Granqvist

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publication2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO)
EditorsA Sill, R Liu, W Li
Number of pages5
Publication date2013
Pages259-263
Publication statusPublished - 2013
MoE publication typeA4 Article in conference proceedings
EventINTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE -
Duration: 1 Jan 1800 → …

Publication series

NameInternational Conference on Manipulation Manufacturing and Measurement on the Nanoscale
PublisherIEEE
ISSN (Print)2373-5422

Fields of Science

  • multi-parametric surface plasmon resonance
  • refractive index
  • thickness
  • thin film deposition
  • absorbing film
  • nanolaminate
  • SPR
  • characterization
  • ellipsometry
  • Langmuir-Blodgett
  • ALD
  • CVD
  • SPECTROSCOPIC ELLIPSOMETRY
  • FILMS
  • 317 Pharmacy

Cite this

Kuncova-Kallio, J., Jokinen, A., Sadowski, J. W., & Granqvist, N. (2013). Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance. In A. Sill, R. Liu, & W. Li (Eds.), 2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO) (pp. 259-263). (International Conference on Manipulation Manufacturing and Measurement on the Nanoscale).
Kuncova-Kallio, Johana ; Jokinen, Annika ; Sadowski, Janusz W. ; Granqvist, Niko. / Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance. 2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO). editor / A Sill ; R Liu ; W Li. 2013. pp. 259-263 (International Conference on Manipulation Manufacturing and Measurement on the Nanoscale).
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title = "Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance",
keywords = "multi-parametric surface plasmon resonance, refractive index, thickness, thin film deposition, absorbing film, nanolaminate, SPR, characterization, ellipsometry, Langmuir-Blodgett, ALD, CVD, SPECTROSCOPIC ELLIPSOMETRY, FILMS, 317 Pharmacy",
author = "Johana Kuncova-Kallio and Annika Jokinen and Sadowski, {Janusz W.} and Niko Granqvist",
note = "Volume: Proceeding volume:",
year = "2013",
language = "English",
series = "International Conference on Manipulation Manufacturing and Measurement on the Nanoscale",
publisher = "IEEE",
pages = "259--263",
editor = "A Sill and R Liu and W Li",
booktitle = "2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO)",

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Kuncova-Kallio, J, Jokinen, A, Sadowski, JW & Granqvist, N 2013, Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance. in A Sill, R Liu & W Li (eds), 2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO). International Conference on Manipulation Manufacturing and Measurement on the Nanoscale, pp. 259-263, INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE, 01/01/1800.

Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance. / Kuncova-Kallio, Johana; Jokinen, Annika; Sadowski, Janusz W.; Granqvist, Niko.

2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO). ed. / A Sill; R Liu; W Li. 2013. p. 259-263 (International Conference on Manipulation Manufacturing and Measurement on the Nanoscale).

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

TY - GEN

T1 - Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance

AU - Kuncova-Kallio, Johana

AU - Jokinen, Annika

AU - Sadowski, Janusz W.

AU - Granqvist, Niko

N1 - Volume: Proceeding volume:

PY - 2013

Y1 - 2013

KW - multi-parametric surface plasmon resonance

KW - refractive index

KW - thickness

KW - thin film deposition

KW - absorbing film

KW - nanolaminate

KW - SPR

KW - characterization

KW - ellipsometry

KW - Langmuir-Blodgett

KW - ALD

KW - CVD

KW - SPECTROSCOPIC ELLIPSOMETRY

KW - FILMS

KW - 317 Pharmacy

M3 - Conference contribution

T3 - International Conference on Manipulation Manufacturing and Measurement on the Nanoscale

SP - 259

EP - 263

BT - 2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO)

A2 - Sill, A

A2 - Liu, R

A2 - Li, W

ER -

Kuncova-Kallio J, Jokinen A, Sadowski JW, Granqvist N. Characterization of Nanolaminate Thickness using Multi-Parametric Surface Plasmon Resonance. In Sill A, Liu R, Li W, editors, 2013 INTERNATIONAL CONFERENCE ON MANIPULATION, MANUFACTURING AND MEASUREMENT ON THE NANOSCALE (3M-NANO). 2013. p. 259-263. (International Conference on Manipulation Manufacturing and Measurement on the Nanoscale).