Focused-Ultrasound-Induced Cavitation Removes Material in a Controlled Fashion

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Most HIFU-induced cavitation applications use low frequencies (< 5 MHz), limiting the spatial precision of material erosion. Here, high-frequency (12 MHz) HIFU-induced cavitation was used to locally remove material from aluminium and thin film samples. Control over pit volume and surface area (pits with 20 - 200 µm diameter) was demonstrated by varying sonication parameters. Pit surface areas and volumes were quantified with a scanning acoustic microscope. Increasing the number of bursts increased the eroded volume but also caused a greater variation in pit area, owing to the stochasticity of inertial cavitation. Increasing the sonication amplitude increased the erosion area, as a larger area of the beam exceeded the local cavitation threshold. These results will be used to find suitable sonication parameters for localized HIFU surface-sampling.
Original languageEnglish
Title of host publication2022 IEEE International Ultrasonics Symposium (IUS)
Publication date1 Dec 2022
ISBN (Print)978-1-6654-7813-7
ISBN (Electronic)978-1-6654-6657-8
Publication statusPublished - 1 Dec 2022
MoE publication typeA4 Article in conference proceedings
Event2022 IEEE International Ultrasonics Symposium (IUS) - Venice, Italy
Duration: 10 Oct 202213 Oct 2022

Publication series

ISSN (Print)1948-5719
ISSN (Electronic)1948-5727

Fields of Science

  • 114 Physical sciences
  • Ultrasound
  • HIFU
  • Material removal

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