General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers

Ari-Pekka Honkanen, Simo Huotari

Research output: Contribution to journalArticleScientificpeer-review

Abstract

Toroidally and spherically bent single crystals are widely employed as optical elements in hard X-ray spectrometry at synchrotron and free-electron laser light sources, and in laboratory-scale instruments. To achieve optimal spectrometer performance, a solid theoretical understanding of the diffraction properties of such crystals is essential. In this work, a general method to calculate the internal stress and strain fields of toroidally bent crystals and how to apply it to predict their diffraction properties is presented. Solutions are derived and discussed for circular and rectangular spherically bent wafers due to their prevalence in contemporary instrumentation.
Original languageEnglish
JournalIUCrJ.
Volume8
Issue number1
Pages (from-to)102-115
Number of pages14
ISSN2052-2525
DOIs
Publication statusPublished - Jan 2021
MoE publication typeA1 Journal article-refereed

Fields of Science

  • ABSORPTION SPECTROSCOPY
  • ANALYZER
  • DYNAMICAL THEORY
  • ENERGY RESOLUTION
  • MONOCHROMATORS
  • NEAR-EDGE STRUCTURE
  • PERFORMANCE
  • REFLECTIVITY
  • SPECTROMETER
  • free-electron lasers
  • hard X-ray spectrometry
  • spherically bent single crystals
  • toroidally bent single crystals
  • 114 Physical sciences

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