Improving the spatial and statistical accuracy in X-ray Raman scattering based direct tomography

Ch J. Sahle, A. Mirone, T. Vincent, A. Kallonen, S. Huotari

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
JournalJournal of Synchrotron Radiation
Volume24
Pages (from-to)476-481
Number of pages6
ISSN0909-0495
DOIs
Publication statusPublished - Mar 2017
MoE publication typeA1 Journal article-refereed

Fields of Science

  • inelastic X-ray scattering
  • imaging
  • direct tomography
  • XRS
  • IMAGE
  • 114 Physical sciences

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