Ion Beam Analysis of SrS:Ce Thin Films

Wei-Min Li, Reijo Lappalainen, Janne Jokinen, Markku Leskelä, Mikko Ritala, Erkki Soininen, Bernd Hüttl

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationInorganic and Organic Electroluminescence
    Place of PublicationBerlin
    PublisherWissenschaft und Technik Verlag
    Publication date1996
    Pages157-160
    ISBN (Print)3-928943-98-7
    Publication statusPublished - 1996
    MoE publication typeA4 Article in conference proceedings

    Fields of Science

    • 116 Chemical sciences

    Cite this

    Li, W-M., Lappalainen, R., Jokinen, J., Leskelä, M., Ritala, M., Soininen, E., & Hüttl, B. (1996). Ion Beam Analysis of SrS:Ce Thin Films. In Inorganic and Organic Electroluminescence (pp. 157-160 ). Berlin: Wissenschaft und Technik Verlag.
    Li, Wei-Min ; Lappalainen, Reijo ; Jokinen, Janne ; Leskelä, Markku ; Ritala, Mikko ; Soininen, Erkki ; Hüttl, Bernd . / Ion Beam Analysis of SrS:Ce Thin Films. Inorganic and Organic Electroluminescence . Berlin : Wissenschaft und Technik Verlag, 1996. pp. 157-160
    @inproceedings{a55f6548260f415c8d1dde0a9e99dda3,
    title = "Ion Beam Analysis of SrS:Ce Thin Films",
    keywords = "116 Chemical sciences",
    author = "Wei-Min Li and Reijo Lappalainen and Janne Jokinen and Markku Leskel{\"a} and Mikko Ritala and Erkki Soininen and Bernd Hüttl",
    note = "Volume: Proceeding volume:",
    year = "1996",
    language = "English",
    isbn = "3-928943-98-7",
    pages = "157--160",
    booktitle = "Inorganic and Organic Electroluminescence",
    publisher = "Wissenschaft und Technik Verlag",
    address = "Germany",

    }

    Li, W-M, Lappalainen, R, Jokinen, J, Leskelä, M, Ritala, M, Soininen, E & Hüttl, B 1996, Ion Beam Analysis of SrS:Ce Thin Films. in Inorganic and Organic Electroluminescence . Wissenschaft und Technik Verlag, Berlin, pp. 157-160 .

    Ion Beam Analysis of SrS:Ce Thin Films. / Li, Wei-Min; Lappalainen, Reijo; Jokinen, Janne; Leskelä, Markku; Ritala, Mikko; Soininen, Erkki; Hüttl, Bernd .

    Inorganic and Organic Electroluminescence . Berlin : Wissenschaft und Technik Verlag, 1996. p. 157-160 .

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    TY - GEN

    T1 - Ion Beam Analysis of SrS:Ce Thin Films

    AU - Li, Wei-Min

    AU - Lappalainen, Reijo

    AU - Jokinen, Janne

    AU - Leskelä, Markku

    AU - Ritala, Mikko

    AU - Soininen, Erkki

    AU - Hüttl, Bernd

    N1 - Volume: Proceeding volume:

    PY - 1996

    Y1 - 1996

    KW - 116 Chemical sciences

    M3 - Conference contribution

    SN - 3-928943-98-7

    SP - 157

    EP - 160

    BT - Inorganic and Organic Electroluminescence

    PB - Wissenschaft und Technik Verlag

    CY - Berlin

    ER -

    Li W-M, Lappalainen R, Jokinen J, Leskelä M, Ritala M, Soininen E et al. Ion Beam Analysis of SrS:Ce Thin Films. In Inorganic and Organic Electroluminescence . Berlin: Wissenschaft und Technik Verlag. 1996. p. 157-160