Label-free 3D super-resolution nanoscope

I. Kassamakov; G. Maconi; M. Järvinen; A. Nolvi; T. Vainikka; P. Raatikainen; T. Arstila; T. Ylitalo; Ilona Stefana Nincâ; K. Ahlers; E. Haeggstroem

doi:10.1117/12.2526111

Label-free 3D super-resolution nanoscope

I. Kassamakov, G. Maconi, M. Järvinen, A. Nolvi, T. Vainikka, P. Raatikainen, T. Arstila, T. Ylitalo, Ilona Stefana Nincâ, K. Ahlers, E. Haeggstroem

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Optical Measurement Systems for Industrial Inspection XI
Editors	Peter Lehmann, Wolfgang Osten, Armando Albertazzi Gonçalves Jr.
Number of pages	8
Place of Publication	Bellingham, WA
Publisher	SPIE - the international society for optics and photonics
Publication date	2019
ISBN (Print)	978-1-5106-2791-8
ISBN (Electronic)	978-1-5106-2792-5
DOIs	https://doi.org/10.1117/12.2526111
Publication status	Published - 2019
MoE publication type	A4 Article in conference proceedings
Event	Optical Measurement Systems for Industrial Inspection - München, Germany Duration: 24 Jun 2019 → 27 Jun 2019 Conference number: 11 https://spie.org/EOM/conferencedetails/optical-measurement-systems-industrial-inspection?SSO=1

Publication series

Name	Proceedings of SPIE
Publisher	SPIE-INT SOC OPTICAL ENGINEERING
Volume	11056
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Fields of Science

Microsphere
nanoscope
3D
Super-resolution
LIGHT
114 Physical sciences

Access to Document

10.1117/12.2526111

Cite this

Kassamakov, I., Maconi, G., Järvinen, M., Nolvi, A., Vainikka, T., Raatikainen, P., Arstila, T., Ylitalo, T., Nincâ, I. S., Ahlers, K., & Haeggstroem, E. (2019). Label-free 3D super-resolution nanoscope. In P. Lehmann, W. Osten, & A. A. Gonçalves Jr. (Eds.), Optical Measurement Systems for Industrial Inspection XI (Proceedings of SPIE; Vol. 11056). SPIE - the international society for optics and photonics. https://doi.org/10.1117/12.2526111

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title = "Label-free 3D super-resolution nanoscope",

keywords = "Microsphere, nanoscope, 3D, Super-resolution, LIGHT, 114 Physical sciences",

author = "I. Kassamakov and G. Maconi and M. J{\"a}rvinen and A. Nolvi and T. Vainikka and P. Raatikainen and T. Arstila and T. Ylitalo and Ninc{\^a}, {Ilona Stefana} and K. Ahlers and E. Haeggstroem",

year = "2019",

doi = "10.1117/12.2526111",

language = "English",

isbn = "978-1-5106-2791-8",

series = "Proceedings of SPIE",

publisher = "SPIE - the international society for optics and photonics",

editor = "Peter Lehmann and Wolfgang Osten and {Gon{\c c}alves Jr.}, {Armando Albertazzi}",

booktitle = "Optical Measurement Systems for Industrial Inspection XI",

address = "United States",

note = "Optical Measurement Systems for Industrial Inspection ; Conference date: 24-06-2019 Through 27-06-2019",

url = "https://spie.org/EOM/conferencedetails/optical-measurement-systems-industrial-inspection?SSO=1",

}

Kassamakov, I , Maconi, G, Järvinen, M, Nolvi, A, Vainikka, T, Raatikainen, P, Arstila, T, Ylitalo, T, Nincâ, IS, Ahlers, K & Haeggstroem, E 2019, Label-free 3D super-resolution nanoscope. in P Lehmann, W Osten & AA Gonçalves Jr. (eds), Optical Measurement Systems for Industrial Inspection XI. Proceedings of SPIE, vol. 11056, SPIE - the international society for optics and photonics, Bellingham, WA, Optical Measurement Systems for Industrial Inspection, München, Germany, 24/06/2019. https://doi.org/10.1117/12.2526111

Label-free 3D super-resolution nanoscope. / Kassamakov, I.; Maconi, G.; Järvinen, M. et al.
Optical Measurement Systems for Industrial Inspection XI. ed. / Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr. Bellingham, WA: SPIE - the international society for optics and photonics, 2019. (Proceedings of SPIE; Vol. 11056).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Label-free 3D super-resolution nanoscope

AU - Kassamakov, I.

AU - Maconi, G.

AU - Järvinen, M.

AU - Nolvi, A.

AU - Vainikka, T.

AU - Raatikainen, P.

AU - Arstila, T.

AU - Ylitalo, T.

AU - Nincâ, Ilona Stefana

AU - Ahlers, K.

AU - Haeggstroem, E.

N1 - Conference code: 11

PY - 2019

Y1 - 2019

KW - Microsphere

KW - nanoscope

KW - 3D

KW - Super-resolution

KW - LIGHT

KW - 114 Physical sciences

U2 - 10.1117/12.2526111

DO - 10.1117/12.2526111

M3 - Conference contribution

SN - 978-1-5106-2791-8

T3 - Proceedings of SPIE

BT - Optical Measurement Systems for Industrial Inspection XI

A2 - Lehmann, Peter

A2 - Osten, Wolfgang

A2 - Gonçalves Jr., Armando Albertazzi

PB - SPIE - the international society for optics and photonics

CY - Bellingham, WA

T2 - Optical Measurement Systems for Industrial Inspection

Y2 - 24 June 2019 through 27 June 2019

ER -