Label-free 3D super-resolution nanoscope

I. Kassamakov, G. Maconi, M. Järvinen, A. Nolvi, T. Vainikka, P. Raatikainen, T. Arstila, T. Ylitalo, Ilona Stefana Nincâ, K. Ahlers, E. Haeggstroem

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection XI
EditorsPeter Lehmann, Wolfgang Osten, Armando Albertazzi Gonçalves Jr.
Number of pages8
Place of PublicationBellingham, WA
PublisherSPIE - the international society for optics and photonics
Publication date2019
ISBN (Print)978-1-5106-2791-8
ISBN (Electronic)978-1-5106-2792-5
DOIs
Publication statusPublished - 2019
MoE publication typeA4 Article in conference proceedings
EventOptical Measurement Systems for Industrial Inspection - München, Germany
Duration: 24 Jun 201927 Jun 2019
Conference number: 11
https://spie.org/EOM/conferencedetails/optical-measurement-systems-industrial-inspection?SSO=1

Publication series

NameProceedings of SPIE
PublisherSPIE-INT SOC OPTICAL ENGINEERING
Volume11056
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Fields of Science

  • Microsphere
  • nanoscope
  • 3D
  • Super-resolution
  • LIGHT
  • 114 Physical sciences

Cite this

Kassamakov, I., Maconi, G., Järvinen, M., Nolvi, A., Vainikka, T., Raatikainen, P., ... Haeggstroem, E. (2019). Label-free 3D super-resolution nanoscope. In P. Lehmann, W. Osten, & A. A. Gonçalves Jr. (Eds.), Optical Measurement Systems for Industrial Inspection XI (Proceedings of SPIE; Vol. 11056). Bellingham, WA: SPIE - the international society for optics and photonics. https://doi.org/10.1117/12.2526111