Label-free 3D super-resolution nanoscope with large field of view

Ivan Kassamakov, Tuomo Ylitalo, Anton Nolvi, Pekka Raatikainen, Riku Paananen, Edward Haeggström

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection XI
EditorsYG Soskind
Number of pages8
PublisherSPIE - the international society for optics and photonics
Publication date2019
Article number109250A
ISBN (Print)978-1-5106-2493-1
DOIs
Publication statusPublished - 2019
MoE publication typeA4 Article in conference proceedings
EventConference on Photonic Instrumentation Engineering - San Francisco, Canada
Duration: 5 Feb 20197 Feb 2019
Conference number: VI

Publication series

NameProceedings of SPIE
PublisherSPIE-INT SOC OPTICAL ENGINEERING
Volume10925
ISSN (Print)0277-786X

Fields of Science

  • Label-free 3D super-resolution
  • nanoscopy
  • stitching
  • RESOLUTION
  • LIGHT
  • 114 Physical sciences

Cite this

Kassamakov, I., Ylitalo, T., Nolvi, A., Raatikainen, P., Paananen, R., & Haeggström, E. (2019). Label-free 3D super-resolution nanoscope with large field of view. In YG. Soskind (Ed.), Optical Measurement Systems for Industrial Inspection XI [109250A] (Proceedings of SPIE; Vol. 10925). SPIE - the international society for optics and photonics. https://doi.org/10.1117/12.2505622