Light-sample interaction in microsphere enhanced 2D super-resolution imaging

Goran Maconi, Ivan Kassamakov, T. Vainikka, Timo Arstila, Edward Haeggstrom

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection XI
EditorsPeter Lehmann, Wolfgang Osten, Armando Albertazzi Gonçalves Jr.
Number of pages7
Place of PublicationBellingham, WA
PublisherSPIE - the international society for optics and photonics
Publication date2019
ISBN (Print)978-1-5106-2791-8
ISBN (Electronic)978-1-5106-2792-5
Publication statusPublished - 2019
MoE publication typeA4 Article in conference proceedings
EventOptical Measurement Systems for Industrial Inspection - München, Germany
Duration: 24 Jun 201927 Jun 2019
Conference number: 11

Publication series

NameProceedings of SPIE
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Fields of Science

  • Super-resolution imaging
  • FDTD
  • simulation
  • Near-field optics
  • Photonic nanojet
  • 114 Physical sciences

Cite this