Light-sample interaction in microsphere enhanced 2D super-resolution imaging

Goran Maconi; Ivan Kassamakov; T. Vainikka; Timo Arstila; Edward Haeggstrom

doi:10.1117/12.2525489

Light-sample interaction in microsphere enhanced 2D super-resolution imaging

Goran Maconi, Ivan Kassamakov, T. Vainikka, Timo Arstila, Edward Haeggstrom

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Optical Measurement Systems for Industrial Inspection XI
Editors	Peter Lehmann, Wolfgang Osten, Armando Albertazzi Gonçalves Jr.
Number of pages	7
Place of Publication	Bellingham, WA
Publisher	SPIE - the international society for optics and photonics
Publication date	2019
ISBN (Print)	978-1-5106-2791-8
ISBN (Electronic)	978-1-5106-2792-5
DOIs	https://doi.org/10.1117/12.2525489
Publication status	Published - 2019
MoE publication type	A4 Article in conference proceedings
Event	Optical Measurement Systems for Industrial Inspection - München, Germany Duration: 24 Jun 2019 → 27 Jun 2019 Conference number: 11 https://spie.org/EOM/conferencedetails/optical-measurement-systems-industrial-inspection?SSO=1

Publication series

Name	Proceedings of SPIE
Publisher	SPIE-INT SOC OPTICAL ENGINEERING
Volume	11056
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Fields of Science

Super-resolution imaging
FDTD
simulation
Near-field optics
Photonic nanojet
114 Physical sciences

Access to Document

10.1117/12.2525489

SPIE_2019_maconi_superresolution_v2_gmAccepted author manuscript, 379 KBLicence: Unspecified

Cite this

Maconi, G., Kassamakov, I., Vainikka, T., Arstila, T., & Haeggstrom, E. (2019). Light-sample interaction in microsphere enhanced 2D super-resolution imaging. In P. Lehmann, W. Osten, & A. A. Gonçalves Jr. (Eds.), Optical Measurement Systems for Industrial Inspection XI (Proceedings of SPIE; Vol. 11056). SPIE - the international society for optics and photonics. https://doi.org/10.1117/12.2525489

Maconi, Goran ; Kassamakov, Ivan ; Vainikka, T. et al. / Light-sample interaction in microsphere enhanced 2D super-resolution imaging. Optical Measurement Systems for Industrial Inspection XI. editor / Peter Lehmann ; Wolfgang Osten ; Armando Albertazzi Gonçalves Jr. Bellingham, WA : SPIE - the international society for optics and photonics, 2019. (Proceedings of SPIE).

@inproceedings{12ca14031ad1448696b640ee2282ba8f,

title = "Light-sample interaction in microsphere enhanced 2D super-resolution imaging",

keywords = "Super-resolution imaging, FDTD, simulation, Near-field optics, Photonic nanojet, 114 Physical sciences",

author = "Goran Maconi and Ivan Kassamakov and T. Vainikka and Timo Arstila and Edward Haeggstrom",

year = "2019",

doi = "10.1117/12.2525489",

language = "English",

isbn = "978-1-5106-2791-8",

series = "Proceedings of SPIE",

publisher = "SPIE - the international society for optics and photonics",

editor = "Peter Lehmann and Wolfgang Osten and {Gon{\c c}alves Jr.}, {Armando Albertazzi }",

booktitle = "Optical Measurement Systems for Industrial Inspection XI",

address = "United States",

note = "Optical Measurement Systems for Industrial Inspection ; Conference date: 24-06-2019 Through 27-06-2019",

url = "https://spie.org/EOM/conferencedetails/optical-measurement-systems-industrial-inspection?SSO=1",

}

Maconi, G , Kassamakov, I, Vainikka, T, Arstila, T & Haeggstrom, E 2019, Light-sample interaction in microsphere enhanced 2D super-resolution imaging. in P Lehmann, W Osten & AA Gonçalves Jr. (eds), Optical Measurement Systems for Industrial Inspection XI. Proceedings of SPIE, vol. 11056, SPIE - the international society for optics and photonics, Bellingham, WA, Optical Measurement Systems for Industrial Inspection, München, Germany, 24/06/2019. https://doi.org/10.1117/12.2525489

Light-sample interaction in microsphere enhanced 2D super-resolution imaging. / Maconi, Goran ; Kassamakov, Ivan; Vainikka, T. et al.

Optical Measurement Systems for Industrial Inspection XI. ed. / Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr. Bellingham, WA : SPIE - the international society for optics and photonics, 2019. (Proceedings of SPIE; Vol. 11056).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Light-sample interaction in microsphere enhanced 2D super-resolution imaging

AU - Maconi, Goran

AU - Kassamakov, Ivan

AU - Vainikka, T.

AU - Arstila, Timo

AU - Haeggstrom, Edward

N1 - Conference code: 11

PY - 2019

Y1 - 2019

KW - Super-resolution imaging

KW - FDTD

KW - simulation

KW - Near-field optics

KW - Photonic nanojet

KW - 114 Physical sciences

U2 - 10.1117/12.2525489

DO - 10.1117/12.2525489

M3 - Conference contribution

SN - 978-1-5106-2791-8

T3 - Proceedings of SPIE

BT - Optical Measurement Systems for Industrial Inspection XI

A2 - Lehmann, Peter

A2 - Osten, Wolfgang

A2 - Gonçalves Jr., Armando Albertazzi

PB - SPIE - the international society for optics and photonics

CY - Bellingham, WA

T2 - Optical Measurement Systems for Industrial Inspection

Y2 - 24 June 2019 through 27 June 2019

ER -

Maconi G , Kassamakov I, Vainikka T, Arstila T, Haeggstrom E. Light-sample interaction in microsphere enhanced 2D super-resolution imaging. In Lehmann P, Osten W, Gonçalves Jr. AA, editors, Optical Measurement Systems for Industrial Inspection XI. Bellingham, WA: SPIE - the international society for optics and photonics. 2019. (Proceedings of SPIE). doi: 10.1117/12.2525489