Molecular dynamics with phase-shift-based electronic stopping for calibration of ion implantation profiles in crystalline silicon

H. Y Chan, Kai Nordlund, H.-J. L Gossmann, M Harris, N. J Montgomery, C. P. A Mulcahy, S Biswas, M. P Srinivasan, F Benistant, C. M Ng, Lap Chan

    Research output: Contribution to journalArticleScientificpeer-review

    Abstract

    "Prediction of the final dopant positions after ion implantation has always been strongly influenced by the choice of stopping models. A molecular dynamics (MD) method is used in this work; the nuclear stopping is treated by accurate pair potentials calculated by density functional theory (DFT). The slowing down due to collisions with electrons will be described by both a non-local semi-empirical model and a local model based on Fermi level phase shift factors. Comparisons with experimental data using both models show that a local pair-specific electronic stopping model is essential in accurately predicting range profiles for any element even at low implant energies where nuclear effects are dominant. (c) 2005 Elsevier B.V. All rights reserved."
    Original languageEnglish
    JournalThin Solid Films
    Volume504
    Issue number1-2
    Pages (from-to)121-125
    Number of pages5
    ISSN0040-6090
    DOIs
    Publication statusPublished - 2006
    MoE publication typeA1 Journal article-refereed

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