Optical Scanning System for Quality Control of GEM-foils

Matti Kalliokoski; Timo Eero Hilden; Rauno Lauhakangas; Jouni Heino; Francisco Garcia; Eija Tuominen; Raimo Turpeinen

doi:10.1016/j.nima.2011.10.058

Optical Scanning System for Quality Control of GEM-foils

Matti Kalliokoski, Timo Eero Hilden, Rauno Lauhakangas, Jouni Heino, Francisco Garcia, Eija Tuominen, Raimo Turpeinen

Helsinki Institute of Physics

Research output: Contribution to journal › Article › Scientific › peer-review

Abstract

An optical scanning system was commissioned and further developed in the Detector Laboratory of Helsinki Institute of Physics and University of Helsinki. It was designed to automatically scan, perform on-line analysis and to classify the overall quality of GEM-foils especially of the GEM-TPC detectors for Super-FRS at FAIR. The optical scanning system consists of precision positioning table, lighting, optics and operating system with analysis software. It has active scanning area of 95×95 cm2 and it can study this area with the minimum resolution of 128 lp/mm. Performance of the system and first results from the GEM-foil uniformity and quality analysis are presented.

Original language	English
Journal	Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volume	664
Issue number	1
Pages (from-to)	223-230
Number of pages	8
ISSN	0168-9002
DOIs	https://doi.org/10.1016/j.nima.2011.10.058
Publication status	Published - 1 Feb 2012
MoE publication type	A1 Journal article-refereed

Fields of Science

114 Physical sciences

Access to Document

10.1016/j.nima.2011.10.058

Cite this

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title = "Optical Scanning System for Quality Control of GEM-foils",

abstract = "An optical scanning system was commissioned and further developed in the Detector Laboratory of Helsinki Institute of Physics and University of Helsinki. It was designed to automatically scan, perform on-line analysis and to classify the overall quality of GEM-foils especially of the GEM-TPC detectors for Super-FRS at FAIR. The optical scanning system consists of precision positioning table, lighting, optics and operating system with analysis software. It has active scanning area of 95×95 cm2 and it can study this area with the minimum resolution of 128 lp/mm. Performance of the system and first results from the GEM-foil uniformity and quality analysis are presented.",

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author = "Matti Kalliokoski and Hilden, {Timo Eero} and Rauno Lauhakangas and Jouni Heino and Francisco Garcia and Eija Tuominen and Raimo Turpeinen",

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journal = "Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment",

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Optical Scanning System for Quality Control of GEM-foils. / Kalliokoski, Matti ; Hilden, Timo Eero; Lauhakangas, Rauno et al.

In: Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, Vol. 664, No. 1, 01.02.2012, p. 223-230.

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

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AU - Kalliokoski, Matti

AU - Hilden, Timo Eero

AU - Lauhakangas, Rauno

AU - Heino, Jouni

AU - Garcia, Francisco

AU - Tuominen, Eija

AU - Turpeinen, Raimo

PY - 2012/2/1

Y1 - 2012/2/1

N2 - An optical scanning system was commissioned and further developed in the Detector Laboratory of Helsinki Institute of Physics and University of Helsinki. It was designed to automatically scan, perform on-line analysis and to classify the overall quality of GEM-foils especially of the GEM-TPC detectors for Super-FRS at FAIR. The optical scanning system consists of precision positioning table, lighting, optics and operating system with analysis software. It has active scanning area of 95×95 cm2 and it can study this area with the minimum resolution of 128 lp/mm. Performance of the system and first results from the GEM-foil uniformity and quality analysis are presented.

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JF - Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

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