Quantifying height of machined steps on copper disk using Fourier domain short coherence interferometer

Research output: Contribution to journalConference articleScientificpeer-review

Original languageEnglish
JournalProceedings of SPIE, the International Society for Optical Engineering
Volume9525
Number of pages7
ISSN0277-786X
DOIs
Publication statusPublished - 2015
MoE publication typeA4 Article in conference proceedings
EventSpie optical metrology / optical measurement systems for industrial inspection - Munich, Germany
Duration: 22 Jun 201525 Jun 2015
Conference number: IX

Fields of Science

  • Compact linear collider
  • copper
  • step height
  • calibration
  • Fourier domain
  • short coherence
  • interferometry
  • SWEPT SOURCE OCT
  • ANTERIOR SEGMENT
  • TOMOGRAPHY
  • LASERS
  • EYE
  • 114 Physical sciences

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