Original language | English |
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Journal | Proceedings of SPIE, the International Society for Optical Engineering |
Volume | 9525 |
Number of pages | 7 |
ISSN | 0277-786X |
DOIs | |
Publication status | Published - 2015 |
MoE publication type | A4 Article in conference proceedings |
Event | Spie optical metrology / optical measurement systems for industrial inspection - Munich, Germany Duration: 22 Jun 2015 → 25 Jun 2015 Conference number: IX |
Fields of Science
- Compact linear collider
- copper
- step height
- calibration
- Fourier domain
- short coherence
- interferometry
- SWEPT SOURCE OCT
- ANTERIOR SEGMENT
- TOMOGRAPHY
- LASERS
- EYE
- 114 Physical sciences