Radiation tests of CMS RPC muon trigger electronic components

Karol Bunkowski, Ivan Kassamakov, Jan Krolikowski, Krzysztof Kierzkowski, Maciej Kuda, Teppo Mäenpää, Krysztof Pozniak, Dominik Rybka, Eija Tuominen, Donatella Ungaro, Grzegorz Wrochna, Wojciech Zabootny

Research output: Contribution to journalArticleScientificpeer-review

Abstract

The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured. (C) 2004 Elsevier B.V. All rights reserved.
Original languageEnglish
JournalNuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volume538
Issue number1-3
Pages (from-to)708-717
Number of pages10
ISSN0168-9002
DOIs
Publication statusPublished - 2005
MoE publication typeA1 Journal article-refereed

Fields of Science

  • 114 Physical sciences

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