Radiation tests of CMS RPC muon trigger electronic components

Karol Bunkowski; Ivan Kassamakov; Jan Krolikowski; Krzysztof Kierzkowski; Maciej Kuda; Teppo Mäenpää; Krysztof Pozniak; Dominik Rybka; Eija Tuominen; Donatella Ungaro; Grzegorz Wrochna; Wojciech Zabootny

doi:10.1016/j.nima.2004.08.113

Radiation tests of CMS RPC muon trigger electronic components

Karol Bunkowski, Ivan Kassamakov, Jan Krolikowski, Krzysztof Kierzkowski, Maciej Kuda, Teppo Mäenpää, Krysztof Pozniak, Dominik Rybka, Eija Tuominen, Donatella Ungaro, Grzegorz Wrochna, Wojciech Zabootny

Helsinki Institute of Physics

Research output: Contribution to journal › Article › Scientific › peer-review

Abstract

The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured. (C) 2004 Elsevier B.V. All rights reserved.

Original language	English
Journal	Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Volume	538
Issue number	1-3
Pages (from-to)	708-717
Number of pages	10
ISSN	0168-9002
DOIs	https://doi.org/10.1016/j.nima.2004.08.113
Publication status	Published - 2005
MoE publication type	A1 Journal article-refereed

Fields of Science

114 Physical sciences

Access to Document

10.1016/j.nima.2004.08.113

Cite this

Bunkowski, K., Kassamakov, I., Krolikowski, J., Kierzkowski, K., Kuda, M., Mäenpää, T., Pozniak, K., Rybka, D., Tuominen, E., Ungaro, D., Wrochna, G., & Zabootny, W. (2005). Radiation tests of CMS RPC muon trigger electronic components. Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, 538(1-3), 708-717. https://doi.org/10.1016/j.nima.2004.08.113

Bunkowski, Karol ; Kassamakov, Ivan ; Krolikowski, Jan ; Kierzkowski, Krzysztof ; Kuda, Maciej ; Mäenpää, Teppo ; Pozniak, Krysztof ; Rybka, Dominik ; Tuominen, Eija ; Ungaro, Donatella ; Wrochna, Grzegorz ; Zabootny, Wojciech. / Radiation tests of CMS RPC muon trigger electronic components. In: Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment. 2005 ; Vol. 538, No. 1-3. pp. 708-717.

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title = "Radiation tests of CMS RPC muon trigger electronic components",

abstract = "The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured. (C) 2004 Elsevier B.V. All rights reserved.",

keywords = "114 Physical sciences",

author = "Karol Bunkowski and Ivan Kassamakov and Jan Krolikowski and Krzysztof Kierzkowski and Maciej Kuda and Teppo M{\"a}enp{\"a}{\"a} and Krysztof Pozniak and Dominik Rybka and Eija Tuominen and Donatella Ungaro and Grzegorz Wrochna and Wojciech Zabootny",

year = "2005",

doi = "10.1016/j.nima.2004.08.113",

language = "English",

volume = "538",

pages = "708--717",

journal = "Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment",

issn = "0168-9002",

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Bunkowski, K, Kassamakov, I, Krolikowski, J, Kierzkowski, K, Kuda, M, Mäenpää, T, Pozniak, K, Rybka, D, Tuominen, E, Ungaro, D, Wrochna, G & Zabootny, W 2005, 'Radiation tests of CMS RPC muon trigger electronic components', Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, vol. 538, no. 1-3, pp. 708-717. https://doi.org/10.1016/j.nima.2004.08.113

Radiation tests of CMS RPC muon trigger electronic components. / Bunkowski, Karol; Kassamakov, Ivan; Krolikowski, Jan; Kierzkowski, Krzysztof; Kuda, Maciej; Mäenpää, Teppo; Pozniak, Krysztof; Rybka, Dominik; Tuominen, Eija; Ungaro, Donatella; Wrochna, Grzegorz; Zabootny, Wojciech.

In: Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, Vol. 538, No. 1-3, 2005, p. 708-717.

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

T1 - Radiation tests of CMS RPC muon trigger electronic components

AU - Bunkowski, Karol

AU - Kassamakov, Ivan

AU - Krolikowski, Jan

AU - Kierzkowski, Krzysztof

AU - Kuda, Maciej

AU - Mäenpää, Teppo

AU - Pozniak, Krysztof

AU - Rybka, Dominik

AU - Tuominen, Eija

AU - Ungaro, Donatella

AU - Wrochna, Grzegorz

AU - Zabootny, Wojciech

PY - 2005

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N2 - The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured. (C) 2004 Elsevier B.V. All rights reserved.

AB - The results of proton irradiation test of electronic devices, selected for the RPC trigger electronic system of the CMS detector, will be presented. For Xilinx Spartan-IIE FPGA the cross-section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops were also investigated, but not observed. For the FLASH memories no single upsets were detected. Only after irradiating with a huge dose permanent damages of devices were observed. For Synchronous Dynamic Random Access Memory (SDRAM), the SEU cross-section was measured. (C) 2004 Elsevier B.V. All rights reserved.

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JF - Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment

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