Removing frequency dependent aberrations in acoustic microscopy

Oskari Mikael Tommiska, Antti Meriläinen, Joni Mikko Kristian Mäkinen, Jere Tapio Johannes Hyvönen, Ari Salmi, Edward Haeggström

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publication2019 IEEE International Ultrasonics Symposium (IUS)
Number of pages3
PublisherIEEE
Publication date2019
Pages593-595
ISBN (Print)978-1-7281-4597-6
ISBN (Electronic)978-1-7281-4596-9, 978-1-7281-4595-2
DOIs
Publication statusPublished - 2019
MoE publication typeA4 Article in conference proceedings
EventIEEE International Ultrasonics Symposium - Glasgow, United Kingdom
Duration: 6 Oct 20199 Oct 2019
Conference number: 11
https://attend.ieee.org/ius-2019/

Publication series

NameIEEE International Ultrasonics Symposium
ISSN (Print)1948-5719
ISSN (Electronic)1948-5727

Fields of Science

  • 114 Physical sciences

Cite this

Tommiska, O. M., Meriläinen, A., Mäkinen, J. M. K., Hyvönen, J. T. J., Salmi, A., & Haeggström, E. (2019). Removing frequency dependent aberrations in acoustic microscopy. In 2019 IEEE International Ultrasonics Symposium (IUS) (pp. 593-595). (IEEE International Ultrasonics Symposium). IEEE. https://doi.org/10.1109/ULTSYM.2019.8925779