Suboxide interface in disproportionating a-SiO studied by x-ray Raman scattering

A. Sakko, C. Sternemann, Ch. J. Sahle, H. Sternemann, O. M. Feroughi, H. Conrad, F. Djurabekova, A. Hohl, G. T. Seidler, M. Tolan, K. Hämäläinen

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
JournalPhysical Review B, Condensed Matter and Materials Physics
Volume81
Issue number20
Pages (from-to)205317
Number of pages7
ISSN1098-0121
DOIs
Publication statusPublished - 2010
MoE publication typeA1 Journal article-refereed

Fields of Science

  • AMORPHOUS-SILICON MONOXIDE
  • OPTICAL-PROPERTIES
  • SPECTRA
  • DENSITY
  • ABSORPTION
  • MOLECULES
  • ELEMENTS
  • MODEL
  • 114 Physical sciences

Cite this

Sakko, A. ; Sternemann, C. ; Sahle, Ch. J. ; Sternemann, H. ; Feroughi, O. M. ; Conrad, H. ; Djurabekova, F. ; Hohl, A. ; Seidler, G. T. ; Tolan, M. ; Hämäläinen, K. / Suboxide interface in disproportionating a-SiO studied by x-ray Raman scattering. In: Physical Review B, Condensed Matter and Materials Physics. 2010 ; Vol. 81, No. 20. pp. 205317.
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author = "A. Sakko and C. Sternemann and Sahle, {Ch. J.} and H. Sternemann and Feroughi, {O. M.} and H. Conrad and F. Djurabekova and A. Hohl and Seidler, {G. T.} and M. Tolan and K. H{\"a}m{\"a}l{\"a}inen",
year = "2010",
doi = "10.1103/PhysRevB.81.205317",
language = "English",
volume = "81",
pages = "205317",
journal = "Physical Review B, Condensed Matter and Materials Physics",
issn = "1098-0121",
publisher = "American Physical Society",
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}

Sakko, A, Sternemann, C, Sahle, CJ, Sternemann, H, Feroughi, OM, Conrad, H, Djurabekova, F, Hohl, A, Seidler, GT, Tolan, M & Hämäläinen, K 2010, 'Suboxide interface in disproportionating a-SiO studied by x-ray Raman scattering' Physical Review B, Condensed Matter and Materials Physics, vol. 81, no. 20, pp. 205317. https://doi.org/10.1103/PhysRevB.81.205317

Suboxide interface in disproportionating a-SiO studied by x-ray Raman scattering. / Sakko, A.; Sternemann, C.; Sahle, Ch. J.; Sternemann, H.; Feroughi, O. M.; Conrad, H.; Djurabekova, F.; Hohl, A.; Seidler, G. T.; Tolan, M.; Hämäläinen, K.

In: Physical Review B, Condensed Matter and Materials Physics, Vol. 81, No. 20, 2010, p. 205317.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Suboxide interface in disproportionating a-SiO studied by x-ray Raman scattering

AU - Sakko, A.

AU - Sternemann, C.

AU - Sahle, Ch. J.

AU - Sternemann, H.

AU - Feroughi, O. M.

AU - Conrad, H.

AU - Djurabekova, F.

AU - Hohl, A.

AU - Seidler, G. T.

AU - Tolan, M.

AU - Hämäläinen, K.

PY - 2010

Y1 - 2010

KW - AMORPHOUS-SILICON MONOXIDE

KW - OPTICAL-PROPERTIES

KW - SPECTRA

KW - DENSITY

KW - ABSORPTION

KW - MOLECULES

KW - ELEMENTS

KW - MODEL

KW - 114 Physical sciences

U2 - 10.1103/PhysRevB.81.205317

DO - 10.1103/PhysRevB.81.205317

M3 - Article

VL - 81

SP - 205317

JO - Physical Review B, Condensed Matter and Materials Physics

JF - Physical Review B, Condensed Matter and Materials Physics

SN - 1098-0121

IS - 20

ER -