Microscope (FEG-SEM)

Scanning electron microscope optimized for fast high-resolution low-kV imaging of biological specimens. Equipped with in-chamber and in-lense secondary and backscattered electron detectors, two in-chamber cameras, a stitching module for large fields of view and a charge compensation system for poorly conductive specimens. Microscope is equipped with Gallium - Focused Ion Beam (FIB) for isotropic (up to 4 nm) and anisotropic (up to 2.5 x 2.5 x 5.0 nm) automatic serial block face imaging.