Aspects of Technical Bias

Martin Schumacher; Frank Staedtler; Wendell Jones; Andreas Scherer

Aspects of Technical Bias

Martin Schumacher, Frank Staedtler, Wendell Jones, Andreas Scherer

Suomen molekyylilääketieteen instituutti

Tutkimustuotos: Artikkeli kirjassa/raportissa/konferenssijulkaisussa › Kirjan luku tai artikkeli › Tieteellinen › vertaisarvioitu

Abstrakti

Variation in microarray data can result from technical and biological sources. While the extent to which factors contribute to this variation has been largely investigated (Bakay et al. 2002; Boedigheimer et al. 2008; Eklund and Szallasi 2008; Fare et al. 2003; Han et al. 2004; Lusa et al. 2007; Novak et al. 2002; Zakharkin et al. 2005), the nature and extent of the signal intensity changes with which variation manifests itself in the data has not been a major focus of research. Using several real microarray data sets with known batch effects, we analyze and describe how technical variation is translated into gene expression changes.

Alkuperäiskieli	englanti
Otsikko	Batch effects and Noise in Microarray Experiments: Sources and Solutions
Sivumäärä	9
Kustantaja	Wiley
Julkaisupäivä	2009
Sivut	51-60
ISBN (painettu)	978-0-470-74138-2
Tila	Julkaistu - 2009
OKM-julkaisutyyppi	A3 Kirjan tai muun kokoomateoksen osa

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Siteeraa tätä

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AB - Variation in microarray data can result from technical and biological sources. While the extent to which factors contribute to this variation has been largely investigated (Bakay et al. 2002; Boedigheimer et al. 2008; Eklund and Szallasi 2008; Fare et al. 2003; Han et al. 2004; Lusa et al. 2007; Novak et al. 2002; Zakharkin et al. 2005), the nature and extent of the signal intensity changes with which variation manifests itself in the data has not been a major focus of research. Using several real microarray data sets with known batch effects, we analyze and describe how technical variation is translated into gene expression changes.

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