Abstrakti
Deposition of zinc glutarate thin films by atomic layer deposition is studied at 200-250 degrees C using zinc acetate and glutaric acid as the precursors. The films are characterized by UV-vis spectrophotometry, X-ray diffraction, Fourier transform infrared spectroscopy, field emission scanning electron microscopy, energy-dispersive X-ray spectroscopy, atomic force microscopy, and time-of-flight elastic recoil detection analysis. According to X-ray diffraction, the films deposited at 200 degrees C are crystalline with a crystal structure matching to zinc glutarate. The elastic recoil detection analysis shows that the composition of the films is a close match to zinc glutarate. Catalytic activity of the films is demonstrated using the copolymerization reaction of propylene oxide and CO2
Alkuperäiskieli | englanti |
---|---|
Artikkeli | 1700512 |
Lehti | Advanced Materials Interfaces |
Vuosikerta | 4 |
Numero | 22 |
Sivumäärä | 6 |
ISSN | 2196-7350 |
DOI - pysyväislinkit | |
Tila | Julkaistu - syyskuuta 2017 |
OKM-julkaisutyyppi | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä, vertaisarvioitu |
Tieteenalat
- 116 Kemia
- 221 Nanoteknologia
- 216 Materiaalitekniikka