@article{d5c534f272e14210b75a8cb4d08a37ea,
title = "Edgeless silicon pad detectors",
keywords = "silicon diode detector, edgeless detector, cryogenic, edge sensitivity, high-energy test beam, 114 Physical sciences",
author = "Solano, {B P} and Abreu, {M C} and V Avati and T Boccali and V Boccone and M Bozzo and R Capra and L Casagrande and W Chen and K Eggert and E Heijne and S Klauke and Z Li and T Maki and L Mirabito and A Morelli and Niinikoski, {T O} and F Oljemark and Palmieri, {V G} and Mendes, {P R} and S Rodrigues and P Siegrist and L Silvestris and P Sousa and S Tapprogge and B Trocme",
year = "2006",
doi = "10.1016/j.nima.2005.11.244",
language = "English",
volume = "560",
pages = "135--138",
journal = "Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment",
issn = "0168-9002",
publisher = "Elsevier Scientific Publ. Co",
number = "1",
}