Effects of polishing and etching on TlBr single crystals

Vasilij Kozlov, Markku Leskelä, Marianna Kemell, H Sipilä

    Tutkimustuotos: ArtikkelijulkaisuKonferenssiartikkeliTieteellinenvertaisarvioitu

    Abstrakti

    The single crystal TlBr, a promising candidate as a room temperature gamma-ray detector has material problems that are related to purity, crystal quality and treatment during the detector manufacturing. In this work, the effects of sizing, polishing and etching on properties of TlBr were studied by field emission scanning electron microscope and by the X-ray diffraction rocking curve method. The hydrothermal and thermal annealings were used as the etch methods. The properly polished sample was characterized by current-voltage, capacitance and photocurrent measurements in the range 7-37 degrees C. (c) 2006 Elsevier B.V. All rights reserved.
    Alkuperäiskielienglanti
    LehtiNuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
    Vuosikerta563
    Numero1
    Sivut58-61
    Sivumäärä4
    ISSN0168-9002
    DOI - pysyväislinkit
    TilaJulkaistu - 2006
    OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisuussa
    Tapahtuma7th International Workshop on Radiation Imaging Detectors - Grenoble, Alankomaat
    Kesto: 4 heinäkuuta 20057 heinäkuuta 2005

    Lisätietoja


    Volume: 563
    Proceeding volume:

    Tieteenalat

    • 116 Kemia

    Siteeraa tätä