Effects of polishing and etching on TlBr single crystals

Vasilij Kozlov, Markku Leskelä, Marianna Kemell, H Sipilä

Tutkimustuotos: ArtikkelijulkaisuKonferenssiartikkeliTieteellinenvertaisarvioitu

Abstrakti

The single crystal TlBr, a promising candidate as a room temperature gamma-ray detector has material problems that are related to purity, crystal quality and treatment during the detector manufacturing. In this work, the effects of sizing, polishing and etching on properties of TlBr were studied by field emission scanning electron microscope and by the X-ray diffraction rocking curve method. The hydrothermal and thermal annealings were used as the etch methods. The properly polished sample was characterized by current-voltage, capacitance and photocurrent measurements in the range 7-37 degrees C. (c) 2006 Elsevier B.V. All rights reserved.
Alkuperäiskielienglanti
LehtiNuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
Vuosikerta563
Numero1
Sivut58-61
Sivumäärä4
ISSN0168-9002
DOI - pysyväislinkit
TilaJulkaistu - 2006
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisuussa
Tapahtuma7th International Workshop on Radiation Imaging Detectors - Grenoble, Alankomaat
Kesto: 4 heinäk. 20057 heinäk. 2005

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Volume: 563

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