Laboratory-scale x-ray absorption spectroscopy of 3d transition metals in inorganic thin films

Tutkimustuotos: ArtikkelijulkaisuArtikkeliTieteellinenvertaisarvioitu

Abstrakti

In this paper we present laboratory-scale X-ray absorption spectroscopy applied to the research of nanometer-scale thin films. We demonstrate the Cu K edge X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) of CuI and CuO thin films grown with atomic layer deposition. Film thicknesses in the investigated samples ranged from 12 to 248 nm. Even from the thinnest films, XANES spectra can be obtained in 5-20 minutes and EXAFS in 1-4 days. In order to prove the capability of laboratory-based XAS for in situ measurements on thin films, we demonstrate an experiment on in situ oxidation of a 248 nm thick CuI film at a temperature of 240 degrees C. These methods have important implications for novel and enhanced possibilities for inorganic thin film research.
Alkuperäiskielienglanti
LehtiDalton Transactions
Vuosikerta51
Numero48
Sivut18593-18602
Sivumäärä10
ISSN1477-9226
DOI - pysyväislinkit
TilaJulkaistu - 13 jouluk. 2022
OKM-julkaisutyyppiA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä, vertaisarvioitu

Tieteenalat

  • 116 Kemia

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