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Mitigating the Capacity Gap in Knowledge Distillation via Iterative Tutoring

Tutkimustuotos: Artikkeli kirjassa/raportissa/konferenssijulkaisussaKonferenssiartikkeliTieteellinenvertaisarvioitu

Abstrakti

Large language models (LLMs) have resulted in significant improvements in understanding and generating natural language. However, their deployment in resourceconstrained environments is limited by their high computational demands. Hence, Knowledge Distillation (KD) has emerged to address such challenges by enabling the transfer of knowledge from a large, pre-trained model (teacher) to a smaller, more efficient model (student). Yet, some bottlenecks exist in the effectiveness of this technique, such as the 'capacity gap' between the teachers' learning abilities and that of the student models, which may negatively impact the distilled model. We address this limitation by introducing a Tutor-Enhanced Iterative Distillation (TEID) to fill the capacity gap, by adding an intermediate-sized tutor model and selective learning strategy to the traditional distillation setup. To achieve further compression, the TEID is repeated iteratively on the tutor and the previously resultant student, with a new smaller student model. Empirical results on the GLUE benchmark show results in mitigating the model capacity gap, while showcasing the need to improve the efficiency and scalability of the distilled models.
Alkuperäiskielienglanti
Otsikko2025 IEEE/ACS 22nd International Conference on Computer Systems and Applications, AICCSA 2025 - Proceedings
Sivumäärä5
JulkaisupaikkaNew York
KustantajaIEEE Computer Society
Julkaisupäivä2025
ISBN (elektroninen)979-8-3315-5693-8
DOI - pysyväislinkit
TilaJulkaistu - 2025
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisuussa
TapahtumaACS/IEEE International Conference on Computer Systems and Applications - Doha, Qatar
Kesto: 19 lokak. 202522 lokak. 2025
Konferenssinumero: 22

Julkaisusarja

NimiProceedings of IEEE/ACS International Conference on Computer Systems and Applications, AICCSA
ISSN (painettu)2161-5322
ISSN (elektroninen)2161-5330

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© 2025 IEEE.

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