Performance of a dispersion-compensating scanning x-ray spectrometer for Compton profile measurements

N Hiraoka, T Buslaps, V Honkimäki, Pekka Suortti

    Tutkimustuotos: ArtikkelijulkaisuArtikkeliTieteellinenvertaisarvioitu

    Kuvaus

    A new X-ray spectrometer has been constructed for Compton profile measurements at beamline ID15B of the ESRF. The spectrometer is based on a novel idea, dispersion compensation, which was proposed earlier. A cylindrically bent Laue monochromator focuses similar to 90 keV synchrotron radiation at about 0.7 m before the sample, and produces a well defined energy or wavelength gradient on the sample. A cylindrically bent Laue analyser almost perfectly compensates this wavelength gradient. Using an Al sample, it has been confirmed that the new spectrometer improves the counting rate by a factor of two compared with the previously constructed 30 keV and 60 keV spectrometers, with a comparable momentum resolution. Because of reduced absorption owing to use of high-energy X-rays, the enhancement of the counting rate is spectacular for heavy-element materials.
    Alkuperäiskielienglanti
    LehtiJournal of Synchrotron Radiation
    Vuosikerta12
    Numero5
    Sivut670-674
    Sivumäärä5
    ISSN0909-0495
    DOI - pysyväislinkit
    TilaJulkaistu - 2005
    OKM-julkaisutyyppiA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä, vertaisarvioitu

    Lainaa tätä

    Hiraoka, N ; Buslaps, T ; Honkimäki, V ; Suortti, Pekka. / Performance of a dispersion-compensating scanning x-ray spectrometer for Compton profile measurements. Julkaisussa: Journal of Synchrotron Radiation. 2005 ; Vuosikerta 12, Nro 5. Sivut 670-674.
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    title = "Performance of a dispersion-compensating scanning x-ray spectrometer for Compton profile measurements",
    abstract = "A new X-ray spectrometer has been constructed for Compton profile measurements at beamline ID15B of the ESRF. The spectrometer is based on a novel idea, dispersion compensation, which was proposed earlier. A cylindrically bent Laue monochromator focuses similar to 90 keV synchrotron radiation at about 0.7 m before the sample, and produces a well defined energy or wavelength gradient on the sample. A cylindrically bent Laue analyser almost perfectly compensates this wavelength gradient. Using an Al sample, it has been confirmed that the new spectrometer improves the counting rate by a factor of two compared with the previously constructed 30 keV and 60 keV spectrometers, with a comparable momentum resolution. Because of reduced absorption owing to use of high-energy X-rays, the enhancement of the counting rate is spectacular for heavy-element materials.",
    author = "N Hiraoka and T Buslaps and V Honkim{\"a}ki and Pekka Suortti",
    year = "2005",
    doi = "10.1107/S0909049505022569",
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    Performance of a dispersion-compensating scanning x-ray spectrometer for Compton profile measurements. / Hiraoka, N; Buslaps, T; Honkimäki, V; Suortti, Pekka.

    julkaisussa: Journal of Synchrotron Radiation, Vuosikerta 12, Nro 5, 2005, s. 670-674.

    Tutkimustuotos: ArtikkelijulkaisuArtikkeliTieteellinenvertaisarvioitu

    TY - JOUR

    T1 - Performance of a dispersion-compensating scanning x-ray spectrometer for Compton profile measurements

    AU - Hiraoka, N

    AU - Buslaps, T

    AU - Honkimäki, V

    AU - Suortti, Pekka

    PY - 2005

    Y1 - 2005

    N2 - A new X-ray spectrometer has been constructed for Compton profile measurements at beamline ID15B of the ESRF. The spectrometer is based on a novel idea, dispersion compensation, which was proposed earlier. A cylindrically bent Laue monochromator focuses similar to 90 keV synchrotron radiation at about 0.7 m before the sample, and produces a well defined energy or wavelength gradient on the sample. A cylindrically bent Laue analyser almost perfectly compensates this wavelength gradient. Using an Al sample, it has been confirmed that the new spectrometer improves the counting rate by a factor of two compared with the previously constructed 30 keV and 60 keV spectrometers, with a comparable momentum resolution. Because of reduced absorption owing to use of high-energy X-rays, the enhancement of the counting rate is spectacular for heavy-element materials.

    AB - A new X-ray spectrometer has been constructed for Compton profile measurements at beamline ID15B of the ESRF. The spectrometer is based on a novel idea, dispersion compensation, which was proposed earlier. A cylindrically bent Laue monochromator focuses similar to 90 keV synchrotron radiation at about 0.7 m before the sample, and produces a well defined energy or wavelength gradient on the sample. A cylindrically bent Laue analyser almost perfectly compensates this wavelength gradient. Using an Al sample, it has been confirmed that the new spectrometer improves the counting rate by a factor of two compared with the previously constructed 30 keV and 60 keV spectrometers, with a comparable momentum resolution. Because of reduced absorption owing to use of high-energy X-rays, the enhancement of the counting rate is spectacular for heavy-element materials.

    U2 - 10.1107/S0909049505022569

    DO - 10.1107/S0909049505022569

    M3 - Article

    VL - 12

    SP - 670

    EP - 674

    JO - Journal of Synchrotron Radiation

    JF - Journal of Synchrotron Radiation

    SN - 0909-0495

    IS - 5

    ER -