Resolving the Nanostructure of Self Organized Thin Films using Corrected Scanning Transmission Electron Microscopy

Corrected scanning transmission electron microscopy (STEM) was used to characterise a novel thin film displaying a complex three dimensional nanostructure. The film was prepared by plasma deposition in such a way that it self-organises into layers of silver islands (each with typical dimensions of a few nanometres) within an aluminium nitride matrix. Successful application of STEM imaging and subsequent analysis was able to determine critical information about the material structure, namely island size, shape and crystalline orientation and the detection of island - matrix intermixing. Such information is essential in being able to predict the properties of this material and the approach adopted here is applicable to any similarly structured material.