Characterization and Identification of Defects in CdTe Detectors Using Scanning Laser Transient Current Technique

Kalliokoski, M. (!!Speaker)

Aktivitet: Typer för tal eller presentation!!Oral presentation

Period5 nov 2020
Händelsetitel2020 Virtual IEEE Nuclear Science Symposium and Medical Imaging Conference: The 27th International Symposium on Room-Temperature Semiconductor Detectors
Typ av evenemangKonferens
OmfattningInternationell