| Originalspråk | engelska |
|---|---|
| Status | Insänt - 25 jan 2018 |
| Evenemang | E-MRS Spring Meeting - --, Strasbourg, Frankrike Varaktighet: 12 dec 2009 → … |
!!Other
| !!Other | E-MRS Spring Meeting |
|---|---|
| Land | Frankrike |
| Ort | Strasbourg |
| Period | 12/12/2009 → … |
Citera det här
Fridlund, C., Nordlund, K., & Djurabekova, F. (2018). Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers. Abstract från E-MRS Spring Meeting, Strasbourg, Frankrike.
@conference{ed96f477420b41ec8d98d3e52102aec8,
title = "Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers",
author = "Christoffer Fridlund and Kai Nordlund and Flyura Djurabekova",
year = "2018",
month = "1",
day = "25",
language = "English",
note = "null ; Conference date: 12-12-2009",
}
Fridlund, C, Nordlund, K & Djurabekova, F 2018, 'Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers', Strasbourg, Frankrike, 12/12/2009, .
Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers. / Fridlund, Christoffer; Nordlund, Kai; Djurabekova, Flyura.
2018. Abstract från E-MRS Spring Meeting, Strasbourg, Frankrike.Forskningsoutput: Konferensbidrag › Sammanfattning › Forskning
TY - CONF
T1 - Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers
AU - Fridlund, Christoffer
AU - Nordlund, Kai
AU - Djurabekova, Flyura
PY - 2018/1/25
Y1 - 2018/1/25
M3 - Abstract
ER -
Fridlund C, Nordlund K, Djurabekova F. Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers. 2018. Abstract från E-MRS Spring Meeting, Strasbourg, Frankrike.