Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers

Forskningsoutput: KonferensbidragSammanfattningForskning

Originalspråkengelska
StatusInsänt - 25 jan 2018
EvenemangE-MRS Spring Meeting - --, Strasbourg, Frankrike
Varaktighet: 12 dec 2009 → …

!!Other

!!OtherE-MRS Spring Meeting
LandFrankrike
OrtStrasbourg
Period12/12/2009 → …

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@conference{ed96f477420b41ec8d98d3e52102aec8,
title = "Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers",
author = "Christoffer Fridlund and Kai Nordlund and Flyura Djurabekova",
year = "2018",
month = "1",
day = "25",
language = "English",
note = "null ; Conference date: 12-12-2009",

}

Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers. / Fridlund, Christoffer; Nordlund, Kai; Djurabekova, Flyura.

2018. Abstract från E-MRS Spring Meeting, Strasbourg, Frankrike.

Forskningsoutput: KonferensbidragSammanfattningForskning

TY - CONF

T1 - Analysis of Defect Formation in High-Fluence Ion Mixing in Si-SiO2 Nanolayers

AU - Fridlund, Christoffer

AU - Nordlund, Kai

AU - Djurabekova, Flyura

PY - 2018/1/25

Y1 - 2018/1/25

M3 - Abstract

ER -