Aspects of Technical Bias

Martin Schumacher; Frank Staedtler; Wendell Jones; Andreas Scherer

Aspects of Technical Bias

Martin Schumacher, Frank Staedtler, Wendell Jones, Andreas Scherer

Institutet för molekylärmedicin i Finland

Forskningsoutput: Kapitel i bok/rapport/konferenshandling › Kapitel › Vetenskaplig › Peer review

Sammanfattning

Variation in microarray data can result from technical and biological sources. While the extent to which factors contribute to this variation has been largely investigated (Bakay et al. 2002; Boedigheimer et al. 2008; Eklund and Szallasi 2008; Fare et al. 2003; Han et al. 2004; Lusa et al. 2007; Novak et al. 2002; Zakharkin et al. 2005), the nature and extent of the signal intensity changes with which variation manifests itself in the data has not been a major focus of research. Using several real microarray data sets with known batch effects, we analyze and describe how technical variation is translated into gene expression changes.

Originalspråk	engelska
Titel på värdpublikation	Batch effects and Noise in Microarray Experiments: Sources and Solutions
Antal sidor	9
Förlag	Wiley
Utgivningsdatum	2009
Sidor	51-60
ISBN (tryckt)	978-0-470-74138-2
Status	Publicerad - 2009
MoE-publikationstyp	A3 Del av bok eller annan forskningsbok

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