Deuterium irradiation-induced defect concentrations in tungsten

Kalle Heinola; Tommy Ahlgren; Elizaveta Vainonen- Ahlgren; J Likonen; Juhani Keinonen

doi:10.1088/0031-8949/2007/T128/018

Deuterium irradiation-induced defect concentrations in tungsten

Kalle Heinola, Tommy Ahlgren, Elizaveta Vainonen- Ahlgren, J Likonen, Juhani Keinonen

Forskningsoutput: Tidskriftsbidrag › Artikel › Vetenskaplig › Peer review

Sammanfattning

Deuterium retention in the implantation-induced defects in polycrystalline tungsten has been studied. Deuterium was implanted with different energies and concentrations of retained D were analysed with secondary ion mass spectrometry and nuclear reaction analysis. Annealings were carried out at four pre-determined temperatures corresponding to four different defect types that can trap deuterium. A quantitative number of each defect type produced by 5, 15 and 30 keV D implantation with a dose of 5.8 x 10(16) cm(-2) was obtained.

Originalspråk	engelska
Tidskrift	Physica Scripta. T
Volym	T128
Sidor (från-till)	91-95
Antal sidor	5
ISSN	0281-1847
DOI	https://doi.org/10.1088/0031-8949/2007/T128/018
Status	Publicerad - 8 mars 2007
MoE-publikationstyp	A1 Tidskriftsartikel-refererad

Vetenskapsgrenar

114 Fysik

Åtkomst av dokument

10.1088/0031-8949/2007/T128/018

Citera det här

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title = "Deuterium irradiation-induced defect concentrations in tungsten",

abstract = "Deuterium retention in the implantation-induced defects in polycrystalline tungsten has been studied. Deuterium was implanted with different energies and concentrations of retained D were analysed with secondary ion mass spectrometry and nuclear reaction analysis. Annealings were carried out at four pre-determined temperatures corresponding to four different defect types that can trap deuterium. A quantitative number of each defect type produced by 5, 15 and 30 keV D implantation with a dose of 5.8 x 10(16) cm(-2) was obtained.",

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AU - Vainonen- Ahlgren, Elizaveta

AU - Likonen, J

AU - Keinonen, Juhani

PY - 2007/3/8

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N2 - Deuterium retention in the implantation-induced defects in polycrystalline tungsten has been studied. Deuterium was implanted with different energies and concentrations of retained D were analysed with secondary ion mass spectrometry and nuclear reaction analysis. Annealings were carried out at four pre-determined temperatures corresponding to four different defect types that can trap deuterium. A quantitative number of each defect type produced by 5, 15 and 30 keV D implantation with a dose of 5.8 x 10(16) cm(-2) was obtained.

AB - Deuterium retention in the implantation-induced defects in polycrystalline tungsten has been studied. Deuterium was implanted with different energies and concentrations of retained D were analysed with secondary ion mass spectrometry and nuclear reaction analysis. Annealings were carried out at four pre-determined temperatures corresponding to four different defect types that can trap deuterium. A quantitative number of each defect type produced by 5, 15 and 30 keV D implantation with a dose of 5.8 x 10(16) cm(-2) was obtained.

KW - 114 Physical sciences

U2 - 10.1088/0031-8949/2007/T128/018

DO - 10.1088/0031-8949/2007/T128/018

M3 - Article

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EP - 95

JO - Physica Scripta. T

JF - Physica Scripta. T

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