Scanning White Light Interferometry, a New 3D Forensics Tool

Ville Heikkinen; Ivan Vladislavov Kassamakov; Edward Haeggström; Sami Lehto; Juha Kiljunen; Tapani Reinikainen; Juha Pekka Aaltonen

doi:10.1109/THS.2011.6107892

Scanning White Light Interferometry, a New 3D Forensics Tool

Ville Heikkinen
, Ivan Vladislavov Kassamakov
, Edward Haeggström
, Sami Lehto
, Juha Kiljunen
, Tapani Reinikainen
, Juha Pekka Aaltonen

Forskningsoutput: Kapitel i bok/rapport/konferenshandling › Konferensbidrag › Vetenskaplig › Peer review

Sammanfattning

Three dimensional (3D) imaging has been introduced
into forensic work. Quantitative height data adds information
compared to the conventional 2D-images when micro-scale
evidence is studied.
We show the potential of Scanning White Light Interferometry
(SWLI) as a 3D imaging method for forensic studies. SWLI
allows rapid, non contact measurements of millimeter-size
objects with nanometer vertical resolution without sample
preparation.
We compared toolmarks and to examined crossing lines on metal.
When studying marks made by diagonal cutters on wires and
firing pin impressions on cartridges we could match cases that
were hard to match with a normal forensic microscope. When
studying crossing lines the confidence of the examiner was
improved from 3.3 ± 1.9 / 5 to 4.2 ± 0.9 / 5 when using 3D images.

Originalspråk	engelska
Titel på värdpublikation	2011 IEEE International Conference on Technologies for Homeland Security
Antal sidor	6
Förlag	IEEE
Utgivningsdatum	nov. 2011
Sidor	332-337
ISBN (tryckt)	978-1-4577-1376-7
DOI	https://doi.org/10.1109/THS.2011.6107892
Status	Publicerad - nov. 2011
MoE-publikationstyp	A4 Artikel i en konferenspublikation
Evenemang	2011 IEEE International Conference on Technologies for Homeland Security - Waltham, Förenta Staterna (USA) Varaktighet: 15 nov. 2011 → 17 nov. 2011

Vetenskapsgrenar

114 Fysik

Åtkomst av dokument

10.1109/THS.2011.6107892

http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6107892

Citera det här

@inproceedings{24dcf41f01854f5985fe06eafdad26ef,

title = "Scanning White Light Interferometry, a New 3D Forensics Tool",

abstract = "Three dimensional (3D) imaging has been introduced into forensic work. Quantitative height data adds information compared to the conventional 2D-images when micro-scale evidence is studied. We show the potential of Scanning White Light Interferometry (SWLI) as a 3D imaging method for forensic studies. SWLI allows rapid, non contact measurements of millimeter-size objects with nanometer vertical resolution without sample preparation. We compared toolmarks and to examined crossing lines on metal. When studying marks made by diagonal cutters on wires and firing pin impressions on cartridges we could match cases that were hard to match with a normal forensic microscope. When studying crossing lines the confidence of the examiner was improved from 3.3 ± 1.9 / 5 to 4.2 ± 0.9 / 5 when using 3D images.",

keywords = "114 Physical sciences, SWLI, Toolmarks, Crossing Lines, 3D imaging",

author = "Ville Heikkinen and Kassamakov, \{Ivan Vladislavov\} and Edward Haeggstr{\"o}m and Sami Lehto and Juha Kiljunen and Tapani Reinikainen and Aaltonen, \{Juha Pekka\}",

year = "2011",

month = nov,

doi = "10.1109/THS.2011.6107892",

language = "English",

isbn = "978-1-4577-1376-7",

pages = "332--337",

booktitle = "2011 IEEE International Conference on Technologies for Homeland Security",

publisher = "IEEE",

address = "United States",

note = "2011 IEEE International Conference on Technologies for Homeland Security ; Conference date: 15-11-2011 Through 17-11-2011",

}

Heikkinen, V, Kassamakov, IV , Haeggström, E, Lehto, S, Kiljunen, J, Reinikainen, T & Aaltonen, JP 2011, Scanning White Light Interferometry, a New 3D Forensics Tool. i 2011 IEEE International Conference on Technologies for Homeland Security. IEEE, s. 332-337, 2011 IEEE International Conference on Technologies for Homeland Security, Waltham, Förenta Staterna (USA), 15/11/2011. https://doi.org/10.1109/THS.2011.6107892

TY - GEN

T1 - Scanning White Light Interferometry, a New 3D Forensics Tool

AU - Heikkinen, Ville

AU - Kassamakov, Ivan Vladislavov

AU - Haeggström, Edward

AU - Lehto, Sami

AU - Kiljunen, Juha

AU - Reinikainen, Tapani

AU - Aaltonen, Juha Pekka

PY - 2011/11

Y1 - 2011/11

N2 - Three dimensional (3D) imaging has been introduced into forensic work. Quantitative height data adds information compared to the conventional 2D-images when micro-scale evidence is studied. We show the potential of Scanning White Light Interferometry (SWLI) as a 3D imaging method for forensic studies. SWLI allows rapid, non contact measurements of millimeter-size objects with nanometer vertical resolution without sample preparation. We compared toolmarks and to examined crossing lines on metal. When studying marks made by diagonal cutters on wires and firing pin impressions on cartridges we could match cases that were hard to match with a normal forensic microscope. When studying crossing lines the confidence of the examiner was improved from 3.3 ± 1.9 / 5 to 4.2 ± 0.9 / 5 when using 3D images.

AB - Three dimensional (3D) imaging has been introduced into forensic work. Quantitative height data adds information compared to the conventional 2D-images when micro-scale evidence is studied. We show the potential of Scanning White Light Interferometry (SWLI) as a 3D imaging method for forensic studies. SWLI allows rapid, non contact measurements of millimeter-size objects with nanometer vertical resolution without sample preparation. We compared toolmarks and to examined crossing lines on metal. When studying marks made by diagonal cutters on wires and firing pin impressions on cartridges we could match cases that were hard to match with a normal forensic microscope. When studying crossing lines the confidence of the examiner was improved from 3.3 ± 1.9 / 5 to 4.2 ± 0.9 / 5 when using 3D images.

KW - 114 Physical sciences

KW - SWLI

KW - Toolmarks

KW - Crossing Lines

KW - 3D imaging

U2 - 10.1109/THS.2011.6107892

DO - 10.1109/THS.2011.6107892

M3 - Conference contribution

SN - 978-1-4577-1376-7

SP - 332

EP - 337

BT - 2011 IEEE International Conference on Technologies for Homeland Security

PB - IEEE

T2 - 2011 IEEE International Conference on Technologies for Homeland Security

Y2 - 15 November 2011 through 17 November 2011

ER -